2024
DOI: 10.1088/2053-1591/ad2bb2
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Ultrasonic non-destructive evaluation study of molecular diffusion bonding of thin copper-aluminum electrode sheets

Shengtao Li,
Huaishu Hou,
Han Yun
et al.

Abstract: The weld quality of copper and aluminum thin electrode sheets in molecular diffusion bonding was non-destructively evaluated using ultrasonic resonance techniques. During the welding process, the intermediate layer material nickel diffuses into the molecules of both the copper sheet and aluminum sheet, resulting in the formation of a solid solution phase layer. This leads to a 5-layer structure in the welded body. If there are defects in this solid solution phase layer, it can cause mutations in the ultrasonic… Show more

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