2009
DOI: 10.1134/s1063776109070048
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Ultrasmall-angle X-ray scattering analysis of photonic crystal structure

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Cited by 13 publications
(10 citation statements)
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“…24 This method was successfully used to investigate different stacking sequences in opal-like structures based on polystyrene, or silicon oxide spheres, 24,25 and of inverse opals based on various oxide materials (TiO 2 , SiO 2 , and Fe 2 O 3 ). 26,27 The measurements were taken at , which lie in the film plane; and (b) crystallographic structure of the inverse opal. In (b): larger "spheres" denote the positions of the centers of cubic (C) basic elements, and the smaller spheres denote ones for the nanotetrahedrons.…”
Section: Methodsmentioning
confidence: 99%
See 1 more Smart Citation
“…24 This method was successfully used to investigate different stacking sequences in opal-like structures based on polystyrene, or silicon oxide spheres, 24,25 and of inverse opals based on various oxide materials (TiO 2 , SiO 2 , and Fe 2 O 3 ). 26,27 The measurements were taken at , which lie in the film plane; and (b) crystallographic structure of the inverse opal. In (b): larger "spheres" denote the positions of the centers of cubic (C) basic elements, and the smaller spheres denote ones for the nanotetrahedrons.…”
Section: Methodsmentioning
confidence: 99%
“…Details of the investigation of IO imperfections are given in a number of papers. [24][25][26][27]39,40 One can consider IO as an assembly of small metallic particles duplicating the shape of the voids between the spheres and connected to each other via thin (several tens of nanometers) and long (several hundreds of nanometers) cross pieces. Hence, the voids of the artificial opal have quasicubic and quasitetrahedral shapes with concave surfaces.…”
Section: Methodsmentioning
confidence: 99%
“…Numerous studies of the crystal structure of spherical colloids have been conducted based on USAXS (Fö rster et al, 2011;Vos et al, 1997;Petukhov et al, 2001;Abramova et al, 2009), light-scattering methods (Pusey et al, 1989;Ackerson, 1990), transmission electron microscopy (Sakamoto et al, 2002) and confocal fluorescence microscopy (van Blaaderen & Wiltzius, 1995;Gasser et al, 2001). Of these methods, USAXS has some notable advantages, including the capability of in situ measurement of opaque samples, measurement of neat samples without fluorescent dye, quantitative results etc.…”
Section: Introductionmentioning
confidence: 99%
“…Experiments with microradian synchrotron diffraction were performed on the Ni inverse PhC deposited onto the conductive substrate; some of experimental images are shown in Figure 2. Presence of two almost symmetrically positioned diffraction maxima in the rocking curves for the most of reflexes indicates that the crystal is composed from blocks with different sequences of packing layers, ABCABC-and ACBACB-type stacking [1,14], the volume ratio those twin components can be roughly estimated from the ratio of integral intensities of Bragg reflexions and it is close to 4:5 for the considered case. Figure 4 shows Q-dependences of individual reflexes, positions of the maxima also correspond to the FCC structure, for example Q (2-20) exp = 0.02746 ± 10 -5 nm -1 and Q (2-20) cal = 0.027911 nm -1 , Q (11-1) exp = 0.01645 ± 10 -5 nm -1 and Q (2-20) cal = 0.017092 nm -1 , i.e.…”
Section: Resultsmentioning
confidence: 77%
“…The inverse PhC films were mounted on a goniometric head, which allows careful orientation of the sample. The 3D crystal structure is investigated by collecting the X-ray diffraction patterns for different rotation angles of the sample around its [2][3][4][5][6][7][8][9][10][11][12][13][14][15][16][17][18][19][20] axis in the range from -60 to + 60 [12].…”
Section: Methodsmentioning
confidence: 99%