2014
DOI: 10.1016/j.actamat.2013.11.058
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Ultrashort carrier lifetime of vapor–liquid–solid-grown GaN/InGaN multi-quantum-well coaxial nanorods

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Cited by 16 publications
(15 citation statements)
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“…It is seen that the derived carrier lifetime increases dramatically with Al composition, listed in Table I . For a typical InGaN/GaN axial nanowire LED sample, the carrier lifetime is ~0.3 ns 27 28 29 . However, with increasing Al incorporation in the AlGaN barrier layer, the carrier lifetime increases to ~0.9, 2.5, and 4.5 ns for LED 1, LED 2, and LED 3, respectively.…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…It is seen that the derived carrier lifetime increases dramatically with Al composition, listed in Table I . For a typical InGaN/GaN axial nanowire LED sample, the carrier lifetime is ~0.3 ns 27 28 29 . However, with increasing Al incorporation in the AlGaN barrier layer, the carrier lifetime increases to ~0.9, 2.5, and 4.5 ns for LED 1, LED 2, and LED 3, respectively.…”
Section: Resultsmentioning
confidence: 99%
“…Large area InGaN nanowire LEDs with emission wavelengths in the range of ultraviolet to near-infrared have been demonstrated 5 14 23 24 25 26 . The carrier dynamics of such devices, however, has been adversely affected by the uncontrolled surface recombination, leading to extremely short carrier lifetime (~0.3 ns, or less) 27 28 29 . The dominance of nonradiative surface recombination has been identified as the major cause for the low quantum efficiency and the very low output power (nW to μW) of axial nanowire LEDs 7 26 30 .…”
mentioning
confidence: 99%
“…To study the carrier dynamic in details, the PL decay curves have been fitted by using the stretched exponential function: where β is the stretching parameter and I(t) is the time-dependent PL intensity 51 . The stretching parameter β was concerned by localized states in the QW, and is closely related to the crystalline quality 52 . All parameters extracted from the fitting process are presented in Table 1 .…”
Section: Resultsmentioning
confidence: 99%
“…Both UIF and EIF samples grown at 710 °C exhibited two-peak decay, i.e., high energy (blue) and low energy (green) decays. This behaviour can be attributed to the spatial fluctuation of In concentration along the axis of the InGaN NWs, which can lead to the formation of shallow (high energy) and deep (low energy) recombination centers 26 27 28 . The carrier recombination in the UIF sample mostly occurred through the deeply localized states, which showed a higher PL emission intensity than the shallow localized states, suggesting a high degree of In fluctuation.…”
Section: Resultsmentioning
confidence: 99%