2022
DOI: 10.1021/acs.jpclett.2c01745
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Ultrapure Blue Thermally Activated Delayed Fluorescence (TADF) Emitters Based on Rigid Sulfur/Oxygen-Bridged Triarylboron Acceptor: MR TADF and D–A TADF

Abstract: Organic light-emitting diodes (OLEDs) still face a significant challenge in finding blue thermally activated delayed fluorescence (TADF) emitters that can achieve narrowband emission and high efficiency. In this work, we successfully design and synthesize a novel kind of TADF emitters based on rigid sulfur/oxygen-bridged triarylboron acceptor for ultrapure blue with narrowband electroluminescence. Time-dependent density functional theory (TD-DFT) calculations and photophysical results indicate the different in… Show more

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Cited by 30 publications
(33 citation statements)
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“…The corresponding rate constants for fluorescence radiative decay ( k r ), intersystem crossing ( k ISC ), and reverse intersystem crossing ( k RISC ) were calculated based on the aforementioned quantum yields and lifetimes of the prompt and delayed fluorescence, and corresponding data are shown in Table S1. Remarkably, owing to the presence of the extremely rigid MR framework, the k r values of TSBA-Cz and TSBA-PhCz are higher (10.35 × 10 7 and 6.98 × 10 7 s –1 ), comparing with the most of the common MR-type TADF materials. , The k nr values of TSBA-Cz and TSBA-PhCz are 2.52 × 10 7 and 1.78 × 10 7 s –1 , respectively, which was responsible for PLQY and OLED device performances of these two emitters. The k ISC and k RISC are 4.49 × 10 8 and 4.17 × 10 8 and 5.29 × 10 4 and 7.62 × 10 4 s –1 , respectively, indicating that the RISC process plays a key role in the photophysical processes for these two reported MR-type TADF emitters.…”
Section: Resultsmentioning
confidence: 98%
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“…The corresponding rate constants for fluorescence radiative decay ( k r ), intersystem crossing ( k ISC ), and reverse intersystem crossing ( k RISC ) were calculated based on the aforementioned quantum yields and lifetimes of the prompt and delayed fluorescence, and corresponding data are shown in Table S1. Remarkably, owing to the presence of the extremely rigid MR framework, the k r values of TSBA-Cz and TSBA-PhCz are higher (10.35 × 10 7 and 6.98 × 10 7 s –1 ), comparing with the most of the common MR-type TADF materials. , The k nr values of TSBA-Cz and TSBA-PhCz are 2.52 × 10 7 and 1.78 × 10 7 s –1 , respectively, which was responsible for PLQY and OLED device performances of these two emitters. The k ISC and k RISC are 4.49 × 10 8 and 4.17 × 10 8 and 5.29 × 10 4 and 7.62 × 10 4 s –1 , respectively, indicating that the RISC process plays a key role in the photophysical processes for these two reported MR-type TADF emitters.…”
Section: Resultsmentioning
confidence: 98%
“…The k ISC and k RISC are 4.49 × 10 8 and 4.17 × 10 8 and 5.29 × 10 4 and 7.62 × 10 4 s –1 , respectively, indicating that the RISC process plays a key role in the photophysical processes for these two reported MR-type TADF emitters. The k RISC value suggests that the introduction of sulfur atom into the rigid molecular structure can accelerate the RISC process in comparison with the oxygen/sulfur-bridged cyclized boron-based emitters …”
Section: Resultsmentioning
confidence: 99%
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