2011
DOI: 10.1109/led.2010.2090938
|View full text |Cite
|
Sign up to set email alerts
|

Ultralow Specific On-Resistance High-Voltage SOI Lateral MOSFET

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1

Citation Types

0
24
0

Year Published

2014
2014
2022
2022

Publication Types

Select...
8
1

Relationship

1
8

Authors

Journals

citations
Cited by 80 publications
(24 citation statements)
references
References 8 publications
0
24
0
Order By: Relevance
“…If a charge imbalance creates a high FOM, as in Fig. As the p-drift width (W p D) of the drain side has no additionally-induced charge, its width should be wider than W p or it should have a higher level of doping concentration [6]- [7]. The width of the p-drift region of the p-body side (W p ) and the width of the region beneath the thick oxide are uniformly 0.5 μm.…”
Section: Optimization Of Charge Balance In the Drift Regionmentioning
confidence: 99%
See 1 more Smart Citation
“…If a charge imbalance creates a high FOM, as in Fig. As the p-drift width (W p D) of the drain side has no additionally-induced charge, its width should be wider than W p or it should have a higher level of doping concentration [6]- [7]. The width of the p-drift region of the p-body side (W p ) and the width of the region beneath the thick oxide are uniformly 0.5 μm.…”
Section: Optimization Of Charge Balance In the Drift Regionmentioning
confidence: 99%
“…Here, the thick oxide helps to improve the reduced surface field (RESURF) by allowing multiple directional depletion. In addition, the lateral-direction electric field decreases due to the low permittivity of the oxide [6]- [7]. Meanwhile, due to the drift charge-balance effect, electric field modulation in the drift region occurs; this in turn, results in the creation of a uniform electric field.…”
Section: Proposed Device Structurementioning
confidence: 99%
“…In 2007, Varadarajan et al introduced trench-gate (vertical channel) into the conventional trench MOSFET and proposed double trenches power MOSFET, which exhibited a R on,sp of 7 mX cm 2 with a V B of 250 V [5], and almost meanwhile, 80V class double trenches MOSFETs with a planar drain or a plug drain were studied by them [6][7][8]. In 2011, trench power MOSFETs based silicon-on-insulator (SOI) were investigated by Xiaorong Luo [9,10], and after which, Zhigang Wang proposed a L-Shaped Trench SOI LDMOS in 2012 [11]. Orouji and Mehrad proposed an inserted P-layer in trench oxide (IPT-LDMOS) in [12].…”
Section: Introductionmentioning
confidence: 99%
“…In the case of discrete LDMOSFET, the epitaxial layer growth on the substrate is used to achieve high BV and low on-resistance [1]. However, the drawback of discrete LDMOSFET is that it could not be integrated with logic circuit even though it improves the performance with epitaxial growth process.…”
Section: Introductionmentioning
confidence: 99%