In this work gated midwave infrared (MWIR) Hg 1−x Cd x Te photodiodes are used to investigate the physical origin of 1/f noise generation. Gated photodiodes were fabricated on liquid phase epitaxy p-type HgCdTe MWIR material with a vacancy doped concentration of 1.6×10 16 cm −3 and x = 0.31. CdTe was thermally deposited and used as both a passivant for the HgCdTe and a mask for the plasma-based type conversion, and ZnS was used as an insulator. Fabricated devices show a R 0 A of 1 − 5 × 10 4 Ωcm 2 at 77K with zero gate bias. Application of 2V to the gate improves the R 0 A by more than two orders of magnitude to 6.0 × 10 6 Ωcm 2 , which corresponds to the p-type surface being at transition between depletion and weak inversion. Trap-assisted tunelling (TAT) current was observed at negative gate biases and reverse junction biases. For gate biases greater than 3V a field-induced junction breakdown was observed. Gated photodiodes show diffusion limited behaviour at zero bias above 200K, and TAT, band-to-band tunnelling, and generation-recombination (GR) limited behaviour below, for gate biases from −8V to 8V . Field-induced junction breakdown current was also observed to be temperature independent. Noise current, I n = αI β f −0.5 trend was observed above 200pA reverse bias dark current, with α = 3.5 × 10 −5 and β = 0.82, which corresponds to the TAT dominated region. Below 200pA, junction GR current starts to dominate and this previously mentioned trend for I n is no longer observed. Junction GR current was not seen to be correlated with 1/f noise in these photodiodes. Downloaded From: http://proceedings.spiedigitallibrary.org/ on 06/17/2016 Terms of Use: http://spiedigitallibrary.org/ss/TermsOfUse.aspx Proc. of SPIE Vol. 6542 65420E-4 Downloaded From: http://proceedings.spiedigitallibrary.org/ on 06/17/2016 Terms of Use: http://spiedigitallibrary.org/ss/TermsOfUse.aspx