2008
DOI: 10.3938/jkps.52.1814
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Ultrahigh-Vacuum-Compatible Diffractometer for Soft X-ray Scattering

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Cited by 5 publications
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“…Reflectometers developed at synchrotron radiation sources for the characterization of optical elements were modified for the study of magnetic thinfilm materials [41,42]. As soft x-ray resonances were found to be very useful for the study of complex ordering in correlated electron systems like charge or orbital order [43] dedicated diffractometers were developed that are now operational at various synchrotron radiation sources [44][45][46][47][48][49][50][51][52][53][54].…”
Section: Methodsmentioning
confidence: 99%
“…Reflectometers developed at synchrotron radiation sources for the characterization of optical elements were modified for the study of magnetic thinfilm materials [41,42]. As soft x-ray resonances were found to be very useful for the study of complex ordering in correlated electron systems like charge or orbital order [43] dedicated diffractometers were developed that are now operational at various synchrotron radiation sources [44][45][46][47][48][49][50][51][52][53][54].…”
Section: Methodsmentioning
confidence: 99%
“…3d) x-ray resonant scattering (XRS) in full combinations of the scattering geometry and the in-coming photon polarization at the 2A beam line in Pohang Light Source [20]. TbMnO 3 (A-type bc cycloid) and Eu 3=4 Y 1=4 MnO 3 (A-type ab cycloid) single crystals were grown by a floating zone method [4,16].…”
mentioning
confidence: 99%
“…RSXS measurements were conducted at beamline 2A of the Pohang Light Source. An ultra-high-vacuum compatible two-circle diffractometer was used with a photodiode as its detector for the measurement [16]. Polarization of the incident x rays was controlled using an elliptical polarization undulator, while both polarizations of the scattered x rays were integrated.…”
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confidence: 99%