Ultrahigh-sensitivity single-photon detection with linear-mode silicon avalanche photodiode

Abstract

We developed an ultrahigh-sensitivity single-photon detector using a linear-mode avalanche photodiode (APD) with a cryogenic low-noise readout circuit; the APD is operated at 78K. The noise-equivalent power of the detector is as low as 2.2x10(-20)W/Hz(1/2) at a wavelength of 450nm. The photon-detection efficiency and dark-count rate (DCR) are 0.72 and 0.0008counts/s, respectively. A low DCR is achieved by thermal treatment for reducing the trapped carriers when the thermal treatment temperature is above 100K.

Invited Review Article: Single-photon sources and detectors

“…The smaller current pulses generated in the linear mode require long measurement times to reduce the readout noise and thus in one recent demonstration a 56% detection efficiency and 0.0008 /s dark-count rate was achieved, but at a 10 kHz maximum repetition rate. 277 While these linear devices can in principle provide photon-number resolution, the noise on the gain and the smaller signals involved can broaden the output current pulse amplitudes so much that pulses due to different numbers of incident photons cannot be resolved. We are unaware of any demonstrated number resolution of these devices.…”

Active plasmon injection scheme for subdiffraction imaging with imperfect negative index flat lens

“…In [60], Chen, et. al adopted a 60dB signal to noise ratio (SNR) in their negative index lens considering an experimental imaging system detector [72]. This corresponds to a SD standard deviation of 10 −3 I(y).…”

Macroscopic state interferometry over large distances using state discrimination

“…The accidental coincidence counting rate due to dark counts is negligible for most single-photon detectors compared to the rates expected from the example considered above. Detector dark counts as low as 0.0008 counts/s [35] have been observed in silicon avalanche photodiodes, for example, with an even lower rate of accidental coincidences.…”