2018
DOI: 10.1038/s41598-018-21711-4
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Ultrafast evolution of electric fields from high-intensity laser-matter interactions

Abstract: The interaction of high-power ultra-short lasers with materials offers fascinating wealth of transient phenomena which are in the core of novel scientific research. Deciphering its evolution is a complicated task that strongly depends on the details of the early phase of the interaction, which acts as complex initial conditions. The entire process, moreover, is difficult to probe since it develops close to target on the sub-picosecond timescale and ends after some picoseconds. Here we present experimental resu… Show more

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Cited by 17 publications
(34 citation statements)
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References 49 publications
(59 reference statements)
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“…The fields present a temporal duration of a few picoseconds and a peak electric field amplitude ∼0.6 TV/m on target. The values obtained are in good agreement with PIC simulations [31] . This innovative diagnostic enables discrimination between the signal carried by the fast electrons and the emitted wave generated by currents in the target.…”
Section: Discussionsupporting
confidence: 87%
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“…The fields present a temporal duration of a few picoseconds and a peak electric field amplitude ∼0.6 TV/m on target. The values obtained are in good agreement with PIC simulations [31] . This innovative diagnostic enables discrimination between the signal carried by the fast electrons and the emitted wave generated by currents in the target.…”
Section: Discussionsupporting
confidence: 87%
“…Indeed, since a larger emitting area produces wider EM radiation, its radial extent is directly proportional to the horizontal size of the detected signal; meanwhile, the signal thickness is directly proportional to the average duration of the detected radiation, which, for the signals reported in Figure 16, is 6 ± 1 ps. Furthermore, its peak value of the electric field has been found equal to 0.8 MV/m on our EOS crystal, corresponding to approximately 0.6 TV/m on target, as confirmed by particle-in-cell (PIC) simulations [31] . In addition, this field value allows only electrons with energies higher than 3 MeV to escape, in agreement with our measurements [31] .…”
Section: Emp Detectionsupporting
confidence: 79%
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“…However, because of a strong divergence of the electron bunch and X-rays, the intensity of these secondary emissions is much weaker than that of the primary one. The electric field induced in an electro-optical crystal by an ejected electron bunch was measured in references [46,47] .…”
Section: Mechanisms Of Electromagnetic Emissionmentioning
confidence: 99%