2017
DOI: 10.1016/j.cplett.2017.01.055
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Ultrafast electron microscopy: Instrument response from the single-electron to high bunch-charge regimes

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Cited by 59 publications
(50 citation statements)
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“…10 Though the factors and the mechanisms associated with beam damage are numerous and multi-faceted, a number of practical approaches have been shown to significantly reduce negative effects of radiolysis, the damage mechanism most relevant to radiation-sensitive organic matter (2). For example, cryogenic methods operate by holding the specimen at reduced temperatures during exposure in order to lower diffusion and kinetic reaction rates, to reduce 15 mass loss, and to minimize the impact of beam-induced thermal effects, especially for poorlyconducting materials (3,4). This has led to significant advances in the ability to study highlysensitive specimens, such as soft matter and biological structures, at sub-nanometer spatial scales (5)(6)(7)(8).…”
mentioning
confidence: 99%
“…10 Though the factors and the mechanisms associated with beam damage are numerous and multi-faceted, a number of practical approaches have been shown to significantly reduce negative effects of radiolysis, the damage mechanism most relevant to radiation-sensitive organic matter (2). For example, cryogenic methods operate by holding the specimen at reduced temperatures during exposure in order to lower diffusion and kinetic reaction rates, to reduce 15 mass loss, and to minimize the impact of beam-induced thermal effects, especially for poorlyconducting materials (3,4). This has led to significant advances in the ability to study highlysensitive specimens, such as soft matter and biological structures, at sub-nanometer spatial scales (5)(6)(7)(8).…”
mentioning
confidence: 99%
“…6 presents the 3D evolution of our non-diffracting wavefunction, while the right column shows the 3D evolution of a Bessel beam. The simulations parameters are acceleration voltage of 20 kV, 100 electrons in a pulse of duration of ~200 fs ( L = 100 fs), which is just about the shortest ultrashort pulses in electron microscopy 52 54 . Technically, launching such a non-diffracting ultrashort electron pulse would require incorporating the holographic scheme of Fig.…”
Section: Resultsmentioning
confidence: 99%
“…Additionally, rigorous comparison of pulsed and continuous beam on one microscope has been challenging on the picosecond scale because the laser-driven cathode modifications replace the normal thermionic or Schottky field emission cathode used for (continuous) operation of the TEM 18 . The size, divergence, and energy spread of the modified cathode's pulsed (photoemitted) beam differ from continuous (thermionic or Schottky) emission, a fundamental challenge when comparing pulsed and continuous beam in laser-based pulsed TEM systems.…”
Section: Introductionmentioning
confidence: 99%