A key feature of monolayer semiconductors, such as transition-metal dichalcogenides, is the poorly screened Coulomb potential, which leads to large exciton binding energy (E b ) and strong renormalization of the quasiparticle bandgap (E g ) by carriers. The latter has been difficult to determine due to cancellation in changes of E b and E g , resulting in little change in optical transition energy at different carrier densities. Here we quantify bandgap renormalization in macroscopic single crystal MoS 2 monolayers on SiO 2 using time and angle resolved photoemission spectroscopy (TR-ARPES). At excitation density above the Mott threshold, E g decreases by as much as 360 meV. We compare the carrier density dependent E g with previous theoretical calculations and show the necessity of knowing both doping and excitation densities in quantifying the bandgap. Atomically thin transition-metal dichalcogenide (TMDC) monolayers and heterojunctions are being broadly explored as model systems for a wide range of electronic, optoelectronic, and quantum processes. The commonly studied TMDC monolayers possess direct bandgaps in the visible to near-IR region [1-3]. Because of the strong many-body Coulomb interactions in monolayer TMDCs, both exciton binding energy (E b ) and bandgap renormalization energy are large [3]. The former lowers the optical transition energy by hundreds meV from E g , while thelatter decreases E g by similar amounts in the presence of charge carriers or excitons. The bandgap renormalization energy (ΔE g ) and decrease in exciton binding energy (ΔE b ) tend to be of similar magnitudes but counteract each other, leading to comparatively modest changes in optical transition energies [4,5]. Since the quasiparticle bandgap E g is the most fundamental quantity and is predicted to be exceptionally sensitive to carrier or exciton densities [4,6,7], there