2020
DOI: 10.1016/j.optmat.2020.110440
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Ultrafast carrier relaxation in SnSe (x=1, 2) thin films observed using femtosecond time-resolved transient absorption spectroscopy

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Cited by 9 publications
(5 citation statements)
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“…The fast and slow decay components could be attributed to the defect trapping and inter-band carrier recombination in β-GaS thin films, respectively. These results are analogous to that reported for other semiconductor materials (Fang et al, 2016;Li et al, 2017;Kong et al, 2018;Yan et al, 2020;Li et al, 2021).…”
Section: Femtosecond Ta Resultssupporting
confidence: 90%
“…The fast and slow decay components could be attributed to the defect trapping and inter-band carrier recombination in β-GaS thin films, respectively. These results are analogous to that reported for other semiconductor materials (Fang et al, 2016;Li et al, 2017;Kong et al, 2018;Yan et al, 2020;Li et al, 2021).…”
Section: Femtosecond Ta Resultssupporting
confidence: 90%
“…The intermediate time constant τ 2 (≈2 ps) represents the ultrafast trapping process following photoexcitation. [36][37][38] As shown in Figure S3, Supporting Information, the energy interval from the top of valence band to the V mo defect state C D1 is about 1.67 eV. To verify the defect-assisted trapping effect in MoSi 2 N 4 film, the time constant τ 2 at different probe wavelengths are compared.…”
Section: Resultsmentioning
confidence: 99%
“…The interpretation of selenium XPS signal is complex and the literature about XPS of SnSe x reports contradictory and wrong interpretation of Se and Sn signals. One can cite the absence of Se 3d 5/2 contribution in SnSe 73 or an area of 3d 3/2 contribution higher than the 3d 5/2 in ref. 74 .…”
Section: Resultsmentioning
confidence: 99%