2021
DOI: 10.1016/j.physb.2021.413347
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Ultrafast carrier dynamics in SnSe thin film studied by femtosecond transient absorption technique

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Cited by 5 publications
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“…With the increasing excitation fluence at the same temperature, the enhanced Auger recombination from the increasing carriers' population shortens the decay time τ, as shown in Fig. 5(f) [43] . At 300 K, electron-phonon scattering is much more significant, owing to more phonons than those at 77 K. Therefore, due to the stronger electron-phonon scattering, the decrease of the decay lifetime at 300 K is not so sensitive as that at 77 K.…”
Section: Ultrafast Carrier Dynamics Analysismentioning
confidence: 85%
“…With the increasing excitation fluence at the same temperature, the enhanced Auger recombination from the increasing carriers' population shortens the decay time τ, as shown in Fig. 5(f) [43] . At 300 K, electron-phonon scattering is much more significant, owing to more phonons than those at 77 K. Therefore, due to the stronger electron-phonon scattering, the decrease of the decay lifetime at 300 K is not so sensitive as that at 77 K.…”
Section: Ultrafast Carrier Dynamics Analysismentioning
confidence: 85%