Abstract:High‐resolution imaging is at the heart of the revolutionary breakthroughs of intelligent technologies, and it is established as an important approach toward high‐sensitivity information extraction/storage. However, due to the incompatibility between non‐silicon optoelectronic materials and traditional integrated circuits as well as the lack of competent photosensitive semiconductors in the infrared region, the development of ultrabroadband imaging is severely impeded. Herein, the monolithic integration of waf… Show more
“…[1][2][3][4][5] In general, low-dimensional vdWMs can be divided into three categories according to their microstructures, including 0D vdWMs (e.g., C 60 , 6 Sb 2 O 3 , 7 etc. ), 1D vdWMs (e.g., selenium, 8 tellurium, 9 Sb 2 Se 3 , 10,11 Ta 2 Ni 3 Se 8 , 12 etc. ), and 2D vdWMs (e.g., black phosphorus, 13 MoS 2 , 14,15 WSe 2 , 15 Bi 2 O 2 Se, 16 ReSe 2 , 17 CrTe 2 , 18 Ge 4 Se 9 , 19 ZnIn 2 S 4 , 20 AgInP 2 S 6 , 21 etc.).…”
Section: Introductionmentioning
confidence: 99%
“…), 1D vdWMs ( e.g. , selenium, 8 tellurium, 9 Sb 2 Se 3 , 10,11 Ta 2 Ni 3 Se 8 , 12 etc. ), and 2D vdWMs ( e.g.…”
Programmable optoelectronic dichroism has been demonstrated by quantum tailoring of Bi2S3 nanowire photodetectors, and multiplexing optical communications as well as polarimetric imaging have been developed.
“…[1][2][3][4][5] In general, low-dimensional vdWMs can be divided into three categories according to their microstructures, including 0D vdWMs (e.g., C 60 , 6 Sb 2 O 3 , 7 etc. ), 1D vdWMs (e.g., selenium, 8 tellurium, 9 Sb 2 Se 3 , 10,11 Ta 2 Ni 3 Se 8 , 12 etc. ), and 2D vdWMs (e.g., black phosphorus, 13 MoS 2 , 14,15 WSe 2 , 15 Bi 2 O 2 Se, 16 ReSe 2 , 17 CrTe 2 , 18 Ge 4 Se 9 , 19 ZnIn 2 S 4 , 20 AgInP 2 S 6 , 21 etc.).…”
Section: Introductionmentioning
confidence: 99%
“…), 1D vdWMs ( e.g. , selenium, 8 tellurium, 9 Sb 2 Se 3 , 10,11 Ta 2 Ni 3 Se 8 , 12 etc. ), and 2D vdWMs ( e.g.…”
Programmable optoelectronic dichroism has been demonstrated by quantum tailoring of Bi2S3 nanowire photodetectors, and multiplexing optical communications as well as polarimetric imaging have been developed.
“…While it exhibits thickness-dependent electronic properties − similarly to TMDs, it possesses promising physical properties such as strong spin–orbital coupling with its chiral structure, , enhanced environmental stability, , and relatively low lattice thermal conductivity . Also, the potentials of Te can allow a wide range of applications in (opto-)electronics, ,− spintronics, thermoelectrics, and selector devices with its outstanding p-type transport behavior, robust chirality, enhanced thermoelectric figure of merit, and fast switching performance, respectively. For the practical integration of such superior properties into the nanoscale regime, a tailored growth technique that principally yields its thin-film form must be developed to address the inherent quasi-1D character and high vapor pressure of Te , leading to the flake or locally anisotropic growth at elevated temperatures. , In this sense, a low-temperature process is an essential prerequisite for preventing its thermal diffusion and desorption while highly scalable and reliable production is still desired.…”
mentioning
confidence: 99%
“…For the practical integration of such superior properties into the nanoscale regime, a tailored growth technique that principally yields its thin-film form must be developed to address the inherent quasi-1D character and high vapor pressure of Te , leading to the flake or locally anisotropic growth at elevated temperatures. , In this sense, a low-temperature process is an essential prerequisite for preventing its thermal diffusion and desorption while highly scalable and reliable production is still desired. Thus far, physical vapor deposition techniques including thermal evaporation, , sputtering, , and pulsed laser deposition have been exclusively employed for Te deposition.…”
mentioning
confidence: 99%
“…34,35 In this sense, a low-temperature process is an essential prerequisite for preventing its thermal diffusion and desorption while highly scalable and reliable production is still desired. Thus far, physical vapor deposition techniques including thermal evaporation, 25,27 sputtering, 31,36 and pulsed laser deposition 30 have been exclusively employed for Te deposition.…”
Scalable production and integration techniques for van der Waals (vdW) layered materials are vital for their implementation in next-generation nanoelectronics. Among available approaches, perhaps the most well-received is atomic layer deposition (ALD) due to its self-limiting layer-by-layer growth mode. However, ALD-grown vdW materials generally require high processing temperatures and/or additional postdeposition annealing steps for crystallization. Also, the collection of ALD-producible vdW materials is rather limited by the lack of a material-specific tailored process design. Here, we report the annealing-free wafer-scale growth of monoelemental vdW tellurium (Te) thin films using a rationally designed ALD process at temperatures as low as 50 °C. They exhibit exceptional homogeneity/crystallinity, precise layer controllability, and 100% step coverage, all of which are enabled by introducing a dual-function co-reactant and adopting a so-called repeating dosing technique. Electronically, vdW-coupled and mixed-dimensional vertical p-n heterojunctions with MoS 2 and n-Si, respectively, are demonstrated with well-defined current rectification as well as spatial uniformity. Additionally, we showcase an ALD-Te-based threshold switching selector with fast switching time (∼40 ns), selectivity (∼10 4 ), and low V th (∼1.3 V). This synthetic strategy allows the low-thermal-budget production of vdW semiconducting materials in a scalable fashion, thereby providing a promising approach for monolithic integration into arbitrary 3D device architectures.
Uncooled broadband spectrum detection, spanning from visible to mid‐wave‐infrared regions, offers immense potential for applications in environmental monitoring, optical telecommunications, and radar systems. While leveraging proven technologies, conventional mid‐wave‐infrared photodetectors are encumbered by high dark currents and the necessity for cryogenic cooling. Correspondingly, innovative low‐dimensional materials like black phosphorus manifest weak photoresponse and instability. Here, tantalum nickel selenide (Ta2NiSe5) infrared photodetectors with an operational wavelength range from 520 nm to 4.6 µm, utilizing a hexagonal boron nitride (h‐BN) encapsulation technique are introduced. The h‐BN encapsulated metal‐Ta2NiSe5‐metal photodetector demonstrates a responsivity of 0.86 A W−1, a noise equivalent power of 1.8 × 10−11 W Hz−1/2, and a peak detectivity of 8.75 × 108 cm Hz1/2 W−1 at 4.6 µm under ambient conditions. Multifaceted mechanisms of photocurrent generation in the novel device prototype subject are scrutinized to varying wavelengths of radiation, by characterizing the temporal‐, bias‐, power‐, and temperature‐dependent photoresponse. Moreover, the photopolarization dependence is delved and concealed‐target imaging is demonstrated, which exhibits polarization angle sensitivity and high‐fidelity imaging across the visible, short‐wave, and mid‐wave‐infrared bands. The observations, which reveal versatile detection modalities, propose Ta2NiSe5 as a promising low‐dimensional material for advanced applications in nano‐optoelectronic device.
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