Ultra-thin metallic foil thickness measurement system using fiber optic low-coherence interferometry

Du, Yanli; Yan, Hao; Nie, Yongjun; Zhang, Xiuda

doi:10.1117/12.635509

SPIE Proceedings

2005

DOI: 10.1117/12.635509

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Ultra-thin metallic foil thickness measurement system using fiber optic low-coherence interferometry

Yanli Du

Hao Yan

Yongjun Nie

et al.

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Ultra-thin metallic foil thickness measurement system using fiber optic low-coherence interferometry

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