2013
DOI: 10.1002/pssr.201308238
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Ultra‐thin (002)‐oriented Al‐doped zinc oxide transparent electrode grown on oxygen‐controlled homo‐seed layer

Abstract: Highly (002)‐oriented Al‐doped zinc oxide (AZO) thin films with the thickness of less than 200 nm have been deposited on an oxygen‐controlled homo‐seed layer at 200 °C by DC magnetron sputtering. With the homo‐seed layer being employed, the full‐width at half maximum (FWHM) of the (002) diffraction peak for the AZO ultra‐thin films decreased from 0.33° to 0.22°, and, the corresponding average grain size increased from 26.8 nm to 43.0 nm. The XRD rocking curves revealed that the AZO ultra‐thin film grown on the… Show more

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Cited by 7 publications
(4 citation statements)
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“…However, this relationship is not always valid as the reducing of the oxygen result in deterioration of preferential orientation and at the same time to improve electrical properties . The better preferred orientation can be caused by the external substrate heating or deposition on the buffer layer . On the contrary, the impact of high energy particles results in the deterioration of crystallinity and the change of preferential orientation …”
Section: The Structure Of Azo Filmmentioning
confidence: 99%
“…However, this relationship is not always valid as the reducing of the oxygen result in deterioration of preferential orientation and at the same time to improve electrical properties . The better preferred orientation can be caused by the external substrate heating or deposition on the buffer layer . On the contrary, the impact of high energy particles results in the deterioration of crystallinity and the change of preferential orientation …”
Section: The Structure Of Azo Filmmentioning
confidence: 99%
“…Its wide direct band gap (3.4 eV) and high exciton binding energy has made ZnO 1 a promising candidate for varied optoelectronic applications, 2,3 primary among which is its utility as a transparent but conducting medium. 4,5 While most forms of undoped ZnO, at room temperature (RT), show n-type character, p-type ZnO is rarely prepared, intentionally or otherwise. 1,6 The debate as to the origin of this n-type character and the associated donor states has mostly centred around two doubly occupied contenders; the oxygen vacancy (V O ) states and interstitial Zn (I Zn ) related defect states.…”
Section: Introductionmentioning
confidence: 99%
“…In addition, the brittle nature of ITO lms limits its application in exible electronics because the lms crack easily when the substrate is bent. To solve these problems, various indium-free materials, including other oxide lms, 5,6 metal thin lms, 7 metal nanowires, 8,9 graphene 10 and carbon nanotubes, 11 have been investigated as compelling alternatives to ITO. Among these alternatives, AgNW lms have been attracting greater interest because of their intriguing electrical, optical and mechanical properties.…”
Section: Introductionmentioning
confidence: 99%