1978
DOI: 10.1016/0040-6090(78)90011-1
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Ultra-microhardness of vacuum-deposited films I: Ultra-microhardness tester

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Cited by 61 publications
(14 citation statements)
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“…In the second half of the twentieth century, instruments which measured indentation depth under low load emerged. These are reported in the early work of Grodzinski [2] in 1953 and then in the 1970s in the works of Alekhin et al [3,4], Ternovskij et al [5] and Bulychev et al [6] in the former Soviet Union, of Kinosita et al [7,8] in Japan, and of Frö hlich et al [9,10] in the GDR. The work of Ternovskij and colleagues described the force-indentation depth curve and a method for deriving hardness and elastic modulus.…”
Section: Brief History Of Developmentsupporting
confidence: 51%
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“…In the second half of the twentieth century, instruments which measured indentation depth under low load emerged. These are reported in the early work of Grodzinski [2] in 1953 and then in the 1970s in the works of Alekhin et al [3,4], Ternovskij et al [5] and Bulychev et al [6] in the former Soviet Union, of Kinosita et al [7,8] in Japan, and of Frö hlich et al [9,10] in the GDR. The work of Ternovskij and colleagues described the force-indentation depth curve and a method for deriving hardness and elastic modulus.…”
Section: Brief History Of Developmentsupporting
confidence: 51%
“…(8). An area function, typically of polynomial form, is then obtained by fitting the values of area obtained from Eq.…”
Section: Range Of Applicationmentioning
confidence: 99%
“…The nanoindentation technique [3][4][5][6][7] has been developed in some decades, and the mechanical properties within a sub-micron or nano scale are widely discussed. The techniques are expected to be useful for measurement of the mechanical properties of thin films or local structure of various materials.…”
Section: Introductionmentioning
confidence: 99%
“…The nanoindentation technique [9][10][11][12][13] has been developed in some decades, and the mechanical properties within a sub-micron or nano scale are widely discussed. The techniques are expected to be useful for measurement of the mechanical properties of thin films or local structure of various materials.…”
Section: Introductionmentioning
confidence: 99%