2018
DOI: 10.1016/j.micpro.2017.11.002
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Ultra-low voltage and energy efficient adders in 28 nm FDSOI exploring poly-biasing for device sizing

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Cited by 3 publications
(6 citation statements)
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“…It has been done to see the effect of 22 nm versus 28 nm FDSOI technology on ultra low voltage design problems. Energy per operation and leakage current obtained for all full adders in this study are much lower than [6] and [14]. The amount of energy per addition for [6] is more than 12X of that for the Xor based adder in this study.…”
Section: Discussionmentioning
confidence: 53%
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“…It has been done to see the effect of 22 nm versus 28 nm FDSOI technology on ultra low voltage design problems. Energy per operation and leakage current obtained for all full adders in this study are much lower than [6] and [14]. The amount of energy per addition for [6] is more than 12X of that for the Xor based adder in this study.…”
Section: Discussionmentioning
confidence: 53%
“…Energy per operation and leakage current obtained for all full adders in this study are much lower than [6] and [14]. The amount of energy per addition for [6] is more than 12X of that for the Xor based adder in this study. Leakage is a key issue in ultra low voltage design.…”
Section: Discussionmentioning
confidence: 53%
See 3 more Smart Citations