2018
DOI: 10.1364/oe.26.004421
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Ultra-low loss ridge waveguides on lithium niobate via argon ion milling and gas clustered ion beam smoothening

Abstract: Lithium niobate's use in integrated optics is somewhat hampered by the lack of a capability to create low loss waveguides with strong lateral index confinement. Thin film single crystal lithium niobate is a promising platform for future applications in integrated optics due to the availability of a strong electro-optic effect in this material coupled with the possibility of strong vertical index confinement. However, sidewalls of etched waveguides are typically rough in most etching procedures, exacerbating pr… Show more

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Cited by 56 publications
(24 citation statements)
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“…It's worth noting that there is no post process or added cladding of the measured waveguide. The loss can thus be reduced by optimizing such processing, as is the case with addition of thermal oxidation in silicon waveguides [20,21], or with use of gas cluster ion beam smoothening [22]. In the BTO case reduced index contrast between the DSO substrate and the top BTO layer (the refractive index of BTO and DSO are, respectively, 2.38 and 2.13, as determined by the prism coupling method) would result in poorer light confinement even though the etch is deeper; the loss cannot be directly compared to that in LN.…”
Section: Optical Performance Characterization and Discussionmentioning
confidence: 99%
“…It's worth noting that there is no post process or added cladding of the measured waveguide. The loss can thus be reduced by optimizing such processing, as is the case with addition of thermal oxidation in silicon waveguides [20,21], or with use of gas cluster ion beam smoothening [22]. In the BTO case reduced index contrast between the DSO substrate and the top BTO layer (the refractive index of BTO and DSO are, respectively, 2.38 and 2.13, as determined by the prism coupling method) would result in poorer light confinement even though the etch is deeper; the loss cannot be directly compared to that in LN.…”
Section: Optical Performance Characterization and Discussionmentioning
confidence: 99%
“…It's worth noting that there is no post process or added cladding of the measured waveguide. The loss can thus be reduced by optimizing such processing, as is the case with addition of thermal oxidation in silicon waveguides [20,21], or with use of gas cluster ion beam smoothening [22]. In the BTO case reduced index contrast between the DSO substrate and the top BTO layer (the refractive index of BTO and DSO are respectively 2.38 and 2.13, as determined by the prism coupling method) would result in poorer light con nement even though the etch is deeper; the loss cannot be directly compared to that in LN.…”
Section: Optical Performance Characterization and Discussionmentioning
confidence: 99%
“…7(c)] [36,47], further demonstrating the versatility of the LNOI platform. Besides microcavities, low-loss optical waveguides based on dry etching LN have also been reported by many groups and used for various applications [48][49][50][51][52][53].…”
Section: Direct Dry Etching Of Lnmentioning
confidence: 99%