Ultra compact multitip scanning tunneling microscope with a diameter of 50 mm

Cherepanov, Vasily; Zubkov, Evgeny; Junker, Hubertus; Korte, Stefan; Blab, Marcus; Coenen, Peter; Voigtländer, Bert

doi:10.1063/1.3694990

Cited by 41 publications

(40 citation statements)

References 21 publications

(18 reference statements)

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“…Each tip has an individual ring for xy-motion and a tube piezo for z-motion. 14,15 Atomic resolution on Si(111) − (7 × 7) is achieved with each tip. The STM is equipped with a scanning electron microscope (SEM) for precise positioning of the individual tips.…”

Section: Methodsmentioning

confidence: 99%

Scanning tunneling potentiometry implemented into a multi-tip setup by software

Lüpke

Korte

Cherepanov

et al. 2015

Review of Scientific Instruments

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We present a multi-tip scanning tunneling potentiometry technique that can be implemented into existing multi-tip scanning tunneling microscopes without installation of additional hardware. The resulting setup allows flexible in situ contacting of samples under UHV conditions and subsequent measurement of the sample topography and local electric potential with resolution down to Å and μV, respectively. The performance of the potentiometry feedback is demonstrated by thermovoltage measurements on the Ag/Si(111)−(3×3)R30∘ surface by resolving a standing wave pattern. Subsequently, the ability to map the local transport field as a result of a lateral current through the sample surface is shown on Ag/Si(111)−(3×3)R30∘ and Si(111) − (7 × 7) surfaces.

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Section: Methodsmentioning

confidence: 99%

Scanning tunneling potentiometry implemented into a multi-tip setup by software

Lüpke

Korte

Cherepanov

et al. 2015

Review of Scientific Instruments

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“…Here, we use a four-tip scanning tunneling microscope (STM) [4] for distance-dependent measurements of the fourpoint resistance on Si(111), as shown in the inset in Fig. 1 for a linear tip arrangement, in combination with a three-layer model for charge transport.…”

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confidence: 99%

Surface and Step Conductivities on Si(111) Surfaces

et al. 2015

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Four-point measurements using a multitip scanning tunneling microscope are carried out in order to determine surface and step conductivities on Si(111) surfaces. In a first step, distance-dependent four-point measurements in the linear configuration are used in combination with an analytical three-layer model for charge transport to disentangle the 2D surface conductivity from nonsurface contributions. A termination of the Si(111) surface with either Bi or H results in the two limiting cases of a pure 2D or 3D conductance, respectively. In order to further disentangle the surface conductivity of the step-free surface from the contribution due to atomic steps, a square four-probe configuration is applied as a function of the rotation angle. In total, this combined approach leads to an atomic step conductivity of σ(step)=(29±9) Ω(-1) m(-1) and to a step-free surface conductivity of σ(surf)=(9±2)×10(-6) Ω(-1)/□ for the Si(111)-(7×7) surface.

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“…Compared to the conventional single-STM * mikse@nanotech.dtu.dk setups, which reflect local properties, the multiprobe signal provides additional information being a transport quantity. Multiprobe measurements have been used to characterize several systems: anisotropic transport [32], nanowires [24,33], carbon nanotubes [34], graphene nanoribbons [31], grain boundaries both in graphene [35,36] and other materials [37], and monolayer and bilayer graphene [38][39][40].…”

Section: Introductionmentioning

confidence: 99%

Dual-probe spectroscopic fingerprints of defects in graphene

et al. 2014

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Recent advances in experimental techniques emphasize the usefulness of multiple scanning probe techniques when analyzing nanoscale samples. Here, we analyze theoretically dual-probe setups with probe separations in the nanometer range, i.e., in a regime where quantum coherence effects can be observed at low temperatures. In a dual-probe setup the electrons are injected at one probe and collected at the other. The measured conductance reflects the local transport properties on the nanoscale, thereby yielding information complementary to that obtained with a standard one-probe setup (the local density of states). In this work we develop a real-space Green's function method to compute the conductance. This requires an extension of the standard calculation schemes, which typically address a finite sample between the probes. In contrast, the developed method makes no assumption of the sample size (e.g., an extended graphene sheet). Applying this method, we study the transport anisotropies in pristine graphene sheets, and analyze the spectroscopic fingerprints arising from quantum interference around single-site defects, such as vacancies and adatoms. Furthermore, we demonstrate that the dual-probe setup is a useful tool for characterizing the electronic transport properties of extended defects or designed nanostructures. In particular, we show that nanoscale perforations, or antidots, in a graphene sheet display Fano-type resonances with a strong dependence on the edge geometry of the perforation.

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Ultra compact multitip scanning tunneling microscope with a diameter of 50 mm

Cited by 41 publications

References 21 publications

Scanning tunneling potentiometry implemented into a multi-tip setup by software

Scanning tunneling potentiometry implemented into a multi-tip setup by software

Surface and Step Conductivities on Si(111) Surfaces

Dual-probe spectroscopic fingerprints of defects in graphene

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