Ueber die Reflexion an Flüssigkeiten

Jamin,

doi:10.1002/andp.18511580116

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“…We chose spectroscopic ellipsometry as the complementary technique. Although the wavelength of the light involved in ellipsometry is on the order of a hundred nanometers and much larger than a molecular scale, accurate and precise measurements of the phase shift and amplitude ratio of p-polarized and s-polarized light enable us to obtain the molecular-scale information at interfaces. , Single-wavelength ellipsometry has been used to analyze the surface roughness at the surface of molecular liquids. − For ILs, single-wavelength ellipsometry has been used to determine the thickness of IL films coated on substrates. − In the present paper, we will show a spectroscopic ellipsometry study of the surface of [TOMA + ][C 4 C 4 N – ]. An analysis incorporating the surface roughness predicted by the CW theory and the ionic multilayers obtained by XR well reproduces the results of spectroscopic ellipsometry, illustrating that both spectroscopic ellipsometry results and XR results do not contradict the CW theory for the [TOMA + ][C 4 C 4 N – ] surface and that spectroscopic ellipsometry can be used to detect surface structures at ionic liquid interfaces.…”

Section: Introductionmentioning

confidence: 99%

Surface Structure of a Hydrophobic Ionic Liquid Probed by Spectroscopic Ellipsometry

2012

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The surface of an ionic liquid, trioctylmethylammonium bis(nonafluorobutanesulfonyl) amide ([TOMA + ]-[C 4 C 4 N − ]) has been studied using spectroscopic ellipsometry at 300 K. The values for delta, which is the phase difference between p-polarized and s-polarized reflection coefficients, deviate from zero to positive values, suggesting that spectroscopic ellipsometry detects surface structures such as surface roughness and surface layers at the [TOMA + ][C 4 C 4 N − ] surface. A model taking into account not only the surface roughness estimated using the capillary wave theory but also ionic multilayers, which was found to exist at the [TOMA + ][C 4 C 4 N − ] surface by a recent X-ray reflectivity study, well reproduces the experimental delta values. Spectroscopic ellipsometry is demonstrated to be a complementary technique to X-ray reflectometry to detect surface structures at ionic liquid interfaces.

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