1962
DOI: 10.1002/zaac.19623140307
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Über Mischsalzkontakte. XV. Selektive Hydrierung von Cyclopropan und Propen an Nickelkontakten. II

Abstract: Es wurde die Hydrierung von Propen und die destruktive Hydrierung von Cyclopropan an Kontakten untersucht, die aus Nickel‐Zink‐Mischoxalaten und Nickel‐Cadmium‐Mischoxalaten durch Zersetzung im Vakuum hergestellt wurden. Es konnte eine vollständige Selektivierung erreicht werden; bei größeren Mengen Cadmiumoxyd im Kontakt wird auch Propen nur noch teilweise hydriert. Weiterhin wurde der Einfluß von Nickeloxyd untersucht. Nickeloxyd aktiviert als p‐Leiter die Hydrierung von Cyclopropan. Die Ergebnisse werden di… Show more

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Cited by 12 publications
(2 citation statements)
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“…The alternative change of hot electron generation (red line) is consistent with the accumulation cycles of the produced CO 2 (black line). Notably, our detection of hot electron current from catalytic nanodiodes is consistent with the early argument given by Schwab [29,30], Solymosi [31], and Langenbeck et al [32]. They suggested the importance of electron flow at oxide-metal interfaces for several catalysis reactions including CO oxidation, SO 2 oxidation, formic acid decomposition, ethylene hydrogenation, cyclohexene hydrogenation and dehydrogenation, and ammonia synthesis [31,33].…”
Section: Oxide-metal Interfacesupporting
confidence: 89%
“…The alternative change of hot electron generation (red line) is consistent with the accumulation cycles of the produced CO 2 (black line). Notably, our detection of hot electron current from catalytic nanodiodes is consistent with the early argument given by Schwab [29,30], Solymosi [31], and Langenbeck et al [32]. They suggested the importance of electron flow at oxide-metal interfaces for several catalysis reactions including CO oxidation, SO 2 oxidation, formic acid decomposition, ethylene hydrogenation, cyclohexene hydrogenation and dehydrogenation, and ammonia synthesis [31,33].…”
Section: Oxide-metal Interfacesupporting
confidence: 89%
“…These definitive experimental confirmations of the flow of hot, high kinetic energy electrons away from the platinum surface where the catalyzed exothermic reaction occurs to the metal-semiconductor interface brings into focus the early suggestions of Schwab [3,4], Szabo and Solymosi [5] as well as Langenbeck et al [6] who argued for the importance of the Schottky diode model of electron flow at oxide-metal interfaces for catalyzed reactions ranging from carbon monoxide oxidation, sulfur dioxide oxidation, formic acid decomposition, ethylene hydrogenation, cyclohexene hydrogenation/ dehydrogenation to ammonia synthesis [5,7]. Their experimental strategies were through the use of ''inverse catalyst'' systems that were fabricated by depositing oxides on films of transition metals that induced large changes in activation energies as a function of oxide thickness along with changes of turnover rates.…”
mentioning
confidence: 92%