Two Transistor Current Mode Active Pixel Sensor

Gruev, Viktor; Yang, Zheng; Spiegel, Jan Van der; Etienne‐Cummings, Ralph

doi:10.1109/iscas.2007.378765

Cited by 9 publications

(3 citation statements)

References 8 publications

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“…Correlated double sampling (CDS) is one of the most common used method to eliminate the effect of linear device variations. 8,9 Recently, it is common to realize CDS function in IC by operational amplifier (OPA) and switch capacitors before the signal is transferred to ADC. However, both OPA and ADC in IC have limited operation voltage range; when the variation is large compared to the signal, the readout voltage might exceed this range and the signal would get lost before CDS is performed.…”

Section: Introductionmentioning

confidence: 99%

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Implementation of correlated double sampling circuit on glass applied for active pixel sensing array

2022

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With the gradual popularization of Internet of Things (IoT) and automation related technologies as well as the rapid development of biometric technology, the application requirements for image sensors have also increased. The improvement of the accuracy of the sensing results has always been a project that people continue to study and optimize. The characteristic of the thin film transistor (TFT), which is often used in active pixel sensor (APS), is likely been affected by temperature and the error during fabrication process, thereby affecting the sensing accuracy. The threshold voltage (Vth) variation is one of the most influential factors among all non‐ideal effect. Correlated double sampling (CDS) is a commonly used technique in eliminating the characteristic variation. In this paper, we proposed a novel CDS circuit composed of TFTs and capacitors which can be integrated on substrate with simulation and implementation. The advantage of the circuit is that Vth variation is eliminated and readout voltage dynamic range is adjusted to fit the operation region of IC at the same time.

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Section: Introductionmentioning

confidence: 99%

“…Correlated double sampling (CDS) is one of the most common used method to eliminate the effect of linear device variations 8,9 . Recently, it is common to realize CDS function in IC by operational amplifier (OPA) and switch capacitors before the signal is transferred to ADC.…”

Section: Introductionmentioning

confidence: 99%

Implementation of correlated double sampling circuit on glass applied for active pixel sensing array

2022

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“…In order to effectively reduce the power consumption, in [6] and [7], a linear current-mode imager scheme is proposed and analyzed. By using a column-level differential amplifier based current-conveyor, the in-pixel transconductance amplifier can operate in triode region, instead of in saturation region.…”

Section: Introductionmentioning

confidence: 99%

Low-power and high-speed current-mode CMOS imager with 1T biasing scheme

Tang

Bermak

2010

2010 IEEE Sensors

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A low-power and high-speed current-mode CMOS image sensor is proposed in this paper. Only one column-level transistor is used in the read-out circuit as a current conveyor to bias the in-pixel transistor operating in triode region. As a result, the current-mode read-out circuit is significantly simplified by the proposed structure, while saving the power by more than half. The proposed scheme enables less than 20ns output settling time due to very low impedance at the internal high capacitance bus, leading to fast operating speed. In addition, a relevant CDS technique is also proposed in order to reduce the first order coefficient variation. A test structure is fabricated using a CMOS 0.35 process.978-1-4244-8168-2/10/$26.00 ©2010 IEEE

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