Abstract:Here, an experimental grazing-incidence small-angle X-ray scattering (GISAXS) study of the nanostructure of a sample composed of a Si(001) wafer covered by a Ni-doped SiO2 thin film and thermally treated at high temperature is described. Previous studies indicated that this type of composite contains Ni nanocrystals mainly inside the thin film and NiSi2 nanoplates buried in the Si wafer. To achieve accurate determinations of low-resolution structural parameters of the nanoparticles derived from the experimenta… Show more
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