Two‐stage component test plans for testing the reliability of a series system

Abstract

Abstract:A system reliability is often evaluated by individual tests of components that constitute the system. These component test plans have advantages over complete system based tests in terms of time and cost. In this paper, we consider the series system with n components, where the lifetime of the i-th component follows exponential distribution with parameter λi. Assuming test costs for the components are different, we develop an efficient algorithm to design a two-stage component test plan that satisfies the usual probability requirements on the system reliability and in addition minimizes the maximum expected cost. For the case of prior information in the form of upper bounds on λi's, we use the genetic algorithm to solve the associated optimization problems which are otherwise difficult to solve using mathematical programming techniques. The two-stage component test plans are cost effective compared to single-stage plans developed by Rajgopal and Mazumdar. We demonstrate through several numerical examples that our approach has the potential to reduce the overall testing costs significantly.

Optimal component test plans for a parallel system based on Type-II censoring

“…See, for example, [2,4]. A recent work in this direction is the two-stage component test plan for testing the reliability of the series system, developed by Vellaisamy and Sankar [7]. Yan and Mazumdar [8,9] developed a test plan for testing the reliability of the parallel system, based on the data obtained from Type-II censoring.…”

An Approach for Reliability Demonstration Test Based on Power‐Law Growth Model

“…Our problem here relates to designing a test plan combining experimental information on the growth stage collected using the two schemes. Some articles such as Vellaisamy and Sankar 25 have discussed a two-stage test plan satisfying this requirement. Kleyner et al 2 describe the information from the development stage in terms of a prior distribution of the reliability of the product.…”