Two-sided empirical Bayes test for truncation parameter using NA samples

Shi, Yimin; Shi, Xiaolin; Yan, Jie

doi:10.1016/j.ins.2004.06.007

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Cited by 4 publications

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“…For instance, Wei [14] developed a empirical Bayes test of parameter for exponential distribution in the case of NA samples using the linear weighted loss functions. Shi et al [15] developed a two-sided empirical Bayes test for the parameter of the truncated distribution family in the case of NA samples. Wang and Shi [16] studied the Bayes test problem for a special exponential family under NA samples.…”

Section: Introductionmentioning

confidence: 99%

Empirical Bayes One-side Test for Inverse Exponential Model based on Negative Associate Samples

Fan¹

2016

AJTAS

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By using the kernel-type density estimation and empirical distribution function in the case of identically distributed and negatively associated samples, the empirical Bayes one-sided test rules for the parameter of inverse exponential distribution are constructed based on negative associate sample under weighted linear loss function, and the asymptotically optimal property is obtained. It is shown that the convergence rates of the proposed empirical Bayes test rules can arbitrarily close to 1/ 2 () − Ο n under suitable conditions.

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Section: Introductionmentioning

confidence: 99%