Two-dimensional vacancy trapping in yttria doped ceria

Shen, Weida; Jiang, Jun; Ni, Chaoying; Voras, Zachary E.; Beebe, Thomas P.; Hertz, Joshua L.

doi:10.1016/j.ssi.2013.11.012

Cited by 21 publications

(23 citation statements)

References 38 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…13). Therefore, the (111) fluorite-bixbyite interface could induce a larger number of oxygen vacancies without the creation of an SCR, which differs from the mechanism proposed for (001) interfaces of fluorite-bixbyite systems in previous studies 15,16 . As was confirmed by STEM imaging, classical force field (FF) simulation also confirmed that the CeO 2 side of the interfaces always remained as the fluorite structure, even though the interface had a high concentration of oxygen vacancies ( Supplementary Fig.…”

Section: Spatial Distributions Of Oxygen Defects At the (111) Interfacecontrasting

confidence: 71%

“…It is worth stressing that such an interfacial charge modulation is a powerful method of creating a high concentration of oxygen vacancies. Interestingly, our STEM and EELS results suggest that the formation of oxygen vacancies at the (111) interface between the fluorite and the bixbyite is not attributable to the creation of SCRs in the CeO 2 layer, in which the calculated Debye length (λ) of~2.4 nm at 300 K 16,35 can result in a~10 nm thick regime of overlapping space charges (4λ) 12 .…”

Section: Resultsmentioning

confidence: 82%

“…It was proposed that a space charge region (SCR) [12][13][14] could be formed by interfacing the fluorite CeO 2 (space group Fm 3m, a = 5.412 Å) with a bixbyite oxide, such as Y 2 O 3 (space group Ia 3, a = 10.607 Å), along the [100] direction 15,16 . The bixbyite structure has a "pseudofluorite" structure with an ordered array of vacant oxygen sites occurring on every fourth site (Supplementary Fig.…”

mentioning

confidence: 99%

See 2 more Smart Citations

Colossal oxygen vacancy formation at a fluorite-bixbyite interface

et al. 2020

View full text Add to dashboard Cite

Oxygen vacancies in complex oxides are indispensable for information and energy technologies. There are several means to create oxygen vacancies in bulk materials. However, the use of ionic interfaces to create oxygen vacancies has not been fully explored. Herein, we report an oxide nanobrush architecture designed to create high-density interfacial oxygen vacancies. An atomically well-defined (111) heterointerface between the fluorite CeO 2 and the bixbyite Y 2 O 3 is found to induce a charge modulation between Y 3+ and Ce 4+ ions enabled by the chemical valence mismatch between the two elements. Local structure and chemical analyses, along with theoretical calculations, suggest that more than 10% of oxygen atoms are spontaneously removed without deteriorating the lattice structure. Our fluorite-bixbyite nanobrush provides an excellent platform for the rational design of interfacial oxide architectures to precisely create, control, and transport oxygen vacancies critical for developing ionotronic and memristive devices for advanced energy and neuromorphic computing technologies.

show abstract

Section: Spatial Distributions Of Oxygen Defects At the (111) Interfacecontrasting

confidence: 71%

Section: Resultsmentioning

confidence: 82%

mentioning

confidence: 99%

See 1 more Smart Citation

Colossal oxygen vacancy formation at a fluorite-bixbyite interface

et al. 2020

View full text Add to dashboard Cite

show abstract

“…Further details on the creation and verication of the multilayered lm compositions can be found in previous reports. 24,25 q À 2q X-ray diffraction (XRD) measurements were performed to determine the orientations of the lms using a Philips X'Pert diffractometer with Cu Ka radiation. Li-off photolithography was employed to fabricate platinum interdigitated electrodes on the surface of the lms.…”

Section: Methodsmentioning

confidence: 99%

Reduced ionic conductivity in biaxially compressed ceria

2014

Self Cite

View full text Add to dashboard Cite

show abstract

“…Electrochemical impedance spectroscopy (EIS) has been used to determine electrochemical properties of the solid electrolyte. From the impedance spectroscopy, it is possible to obtain the information on the contribution of grains, grain boundaries and electrode polarization to the total conductivity [25][26][27]. Impedance spectra for the Ce 0.8 Gd 0.2-x Mg x O 1.9-δ ceramics measured at different temperatures under air are presented in Figs.…”

Section: Electrochemical Performancementioning

confidence: 99%

Effects of Mg2+ addition on structure and electrical properties of gadolinium doped ceria electrolyte ceramics

Cheng

Tian

Yang

2019

PAC

View full text Add to dashboard Cite

Series of Gd 3+ and Mg 2+ co-doped ceria (Ce 0.8 Gd 0.2-x Mg x O 1.9-δ ) powders were prepared by a sol-gel method and electrolyte ceramics were obtained by sintering at 1300°C. Thermogravimetric and differential scanning calorimetry, X-ray diffraction, scanning electron microscope and electrochemical impedance spectroscopy were used for structural, morphology and electrical characterization of the prepared samples. Well crystalline cubic fluorite structured composite was confirmed after calcination at 700°C and the electrolyte ceramics sintered at 1300°C for 4 h was quite dense with uniform microstructure. The electrochemical analysis results displayed that the highest conductivity has the Ce 0.8 Gd 0.14 Mg 0.06 O 1.87 compound, i.e. 0.0203 S/cm at 800°C. Therefore, it was concluded that co-doping with Gd 3+ and Mg 2+ could enhance the electrical properties of the CeO 2 based solid electrolytes.

show abstract

Two-dimensional vacancy trapping in yttria doped ceria

Cited by 21 publications

References 38 publications

Colossal oxygen vacancy formation at a fluorite-bixbyite interface

Colossal oxygen vacancy formation at a fluorite-bixbyite interface

Reduced ionic conductivity in biaxially compressed ceria

Effects of Mg2+ addition on structure and electrical properties of gadolinium doped ceria electrolyte ceramics

Contact Info

Product

Resources

About