2022
DOI: 10.1002/aelm.202200380
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Two‐Dimensional Tellurene Transistors with Low Contact Resistance and Self‐Aligned Catalytic Thinning Process

Abstract: Two‐dimensional (2D) tellurene (Te) has shown its great potential in nanoelectronics for its high carrier mobility and air stability. However, the high‐resistance electrical contact and relatively thick Te channel hinder its ultimate scaling and device performance. Here, the transport property of Te field‐effect transistors using platinum (Pt) contact with high work function is studied, which facilitates the effective hole injection in the p‐type Te channel. The electrical contact to Te using the Y‐function me… Show more

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Cited by 6 publications
(3 citation statements)
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“…Raman characterization confirms that the residue after the thinning process is pure tellurene without other solid‐state products. The thinning process of tellurene under highly reductive potentials is similar to the thinning effect observed in previous observations of tellurene degradation under light illumination 58 . The degradation of tellurene at ~−0.6 V versus RHE can be attributed to the reduction of solid tellurene to soluble Te 2− , which happens at ~−0.67 V versus RHE according to the electrochemical studies of bulk tellurium 30‐32,59 …”
Section: Discussionsupporting
confidence: 85%
See 1 more Smart Citation
“…Raman characterization confirms that the residue after the thinning process is pure tellurene without other solid‐state products. The thinning process of tellurene under highly reductive potentials is similar to the thinning effect observed in previous observations of tellurene degradation under light illumination 58 . The degradation of tellurene at ~−0.6 V versus RHE can be attributed to the reduction of solid tellurene to soluble Te 2− , which happens at ~−0.67 V versus RHE according to the electrochemical studies of bulk tellurium 30‐32,59 …”
Section: Discussionsupporting
confidence: 85%
“…The thinning process of tellurene under highly reductive potentials is similar to the thinning effect observed in previous observations of tellurene degradation under light illumination. 58 The degradation of tellurene at ~−0.6 V versus RHE can be attributed to the reduction of solid tellurene to soluble Te 2− , which happens at ~−0.67 V versus RHE according to the electrochemical studies of bulk tellurium. [30][31][32]59 Finally, we further investigate the electrochemical stability of tellurene in the oxidation potential range.…”
Section: Electrochemical and In-situ Transport Measurements Of H-te A...mentioning
confidence: 99%
“…8b, c) and mechanism analysis (Supplementary Note 4). Consistent with existing works based on solution-prepared Te, higher hole carrier density exists in the thicker Te samples 26,31,32 . For performance comparison, we used the 28 nm thick Te flake as the channel of charge-based FETs with ionic liquid.…”
Section: Room-temperature Volatile and Non-volatile Valley Transistorssupporting
confidence: 89%