Two-dimensional speckle technique for slope error measurements of weakly focusing reflective X-ray optics

Hu, Lingfei; Wang, Hongchang; Fox, Oliver; Sawhney, Kawal

doi:10.1107/s160057752200916x

Cited by 3 publications

(1 citation statement)

References 46 publications

(46 reference statements)

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“…Recent advances in such ex situ techniques include stitching of Fizeau interferograms to form a composite image of X-ray optics for the identification of defects during fabrication or repolishing of mirrors (Huang et al, 2020;da Silva et al, 2023). However, the effectiveness of ex situ metrology is somewhat limited as it cannot account for thermal distortion of optics under beamline conditions (Hu et al, 2022). The effects of beamline conditions and on distortion of the optical surface have been investigated extensively (Zhang et al, 2013;Chumakov et al, 2014;Brumund et al, 2021).…”

Section: Introductionmentioning

confidence: 99%

Passive doubly curved structures for determining clamping forces applied to X-ray optic assemblies

Bainbridge,

Griffiths,

Patel

et al. 2023

J Synchrotron Radiat

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Clamping of indirectly cryogenically cooled X-ray optics is required to ensure effective heat transfer between the optic and heat exchanger. However, clamping forces can result in distortion of the optical surface of monochromators and mirror systems, which causes angular distortions of the subsequent beam. As such, there is a need for greater understanding of how these optics are assembled and how this affects their performance throughout their life cycle. In this paper, the potential for non-contact, in-process monitoring of the clamping force both during and after assembly using an additively manufactured passive structure based on a doubly curved hyperbolic paraboloid and designed for application to the first crystal for the I20 monochromator at Diamond Light Source is investigated numerically and experimentally. The performance of the passive structure both pre- and post-cryogenic quenching is characterized experimentally. Laser displacement measurements reveal approximately 9 µm total displacement in the passive structure per 100 N of bolt preload, corresponding to an effective magnification of the preload adjustment of approximately 2.5×.

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Section: Introductionmentioning

confidence: 99%

Passive doubly curved structures for determining clamping forces applied to X-ray optic assemblies

Bainbridge,

Griffiths,

Patel

et al. 2023

J Synchrotron Radiat

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Research on the beam structures observed from X-ray optics in the far field

Hu,

Wang,

Sutter

et al. 2023

Opt. Express

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For advanced X-ray sources such as synchrotron radiation facilities and X-ray free electron lasers, a smooth, structure-free beam on the far-field plane is usually strongly desired. The formation of the fine structures in far-field images downstream from imperfect optics must be understood. Although numerous studies have discussed the impacts on focused beams, there are still few quantitative theories for the impacts on beams in the far field. This article is an advance on our previous work, which discussed the uniformity of the intensity distribution in the far field. Here, a new theoretical approach is presented. It not only eases the assumptions needed to relate the fine structures to the wavefront curvature, but it also provides a quantitative estimation of the impacts of optical errors. The theoretical result is also verified by X-ray experiments.

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Multilayer Kirkpatrick-Baez focusing mirrors with phase compensation for sub-20 nm focusing at the hard X-ray nanoprobe beamline of SSRF

Jiang,

Xie,

et al. 2024

Opt. Express

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The hard X-ray nanoprobe beamline is the first beamline to take advantage of the full coherent beam to attain the nanoscale focusing at the Shanghai Synchrotron Radiation Facility (SSRF). Here we introduce the beamline and specially go over the features of the multilayer Kirkpatrick-Baez focusing system and its supporting phase compensator system. The performance and stability of the phase compensator are also put to the test. By using the speckle scanning metrology, the wavefront of a focused beam was characterized and intensity distribution near the focus was reconstructed. The focusing performance was greatly enhanced by two phase compensations based on a global optimization technique, and a two-dimensional focal spot of 26 nm × 17 nm was achieved and maintained with good stability.

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Two-dimensional speckle technique for slope error measurements of weakly focusing reflective X-ray optics

Cited by 3 publications

References 46 publications

Passive doubly curved structures for determining clamping forces applied to X-ray optic assemblies

Passive doubly curved structures for determining clamping forces applied to X-ray optic assemblies

Research on the beam structures observed from X-ray optics in the far field

Multilayer Kirkpatrick-Baez focusing mirrors with phase compensation for sub-20 nm focusing at the hard X-ray nanoprobe beamline of SSRF

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