2002
DOI: 10.1063/1.1434307
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Two-dimensional periodic alignment of self-assembled Ge islands on patterned Si(001) surfaces

Abstract: Two-dimensional alignment of Ge islands is obtained by molecular beam epitaxy of Ge on lithographically patterned Si(001) surfaces composed of periodic arrays of square Si mesas. When the period of the Si mesa arrays is reduced to 140 nm, a “one island on one mesa” relationship is achieved. The Ge islands have an average base width of 85 nm and take on the shape of a truncated pyramid with four {114} facets and a (001) top. The patterning also serves to improve the island size uniformity. The dependencies of t… Show more

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Cited by 80 publications
(61 citation statements)
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“…10 This influence of the growth temperature on ad-dimers (or adatoms) may contribute to the formation of Ge islands on the top terrace of the Si mesas at 570 o C observed in Ref. 13. In addition, due to the absence of a Si buffer layer in the samples before the Ge deposition in Ref.…”
Section: A Effect Of the Growth Temperaturementioning
confidence: 99%
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“…10 This influence of the growth temperature on ad-dimers (or adatoms) may contribute to the formation of Ge islands on the top terrace of the Si mesas at 570 o C observed in Ref. 13. In addition, due to the absence of a Si buffer layer in the samples before the Ge deposition in Ref.…”
Section: A Effect Of the Growth Temperaturementioning
confidence: 99%
“…In addition, due to the absence of a Si buffer layer in the samples before the Ge deposition in Ref. 13, the roughness on the terraces 25 and of the step edges 26 will also contribute to the formation of Ge islands on the top and/or the edge of the top terrace by reducing the migration of ad-dimers. …”
Section: A Effect Of the Growth Temperaturementioning
confidence: 99%
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“…We utilize the Ge QDs' tendency to nucleate on locally tensile stressed sites to control the spatial position. The ordered nucleation of the Ge QDs has been demonstrated to be realized by introducing lithographically defined mesa structures [2], or misfit dislocation networks [3] onto the Ge/Si(001) substrate surfaces. The vertical alignment of QDs utilizing the local strain on the apex of the buried QDs has also been reported in the Ge/Si layered structure growth [4].…”
Section: Introductionmentioning
confidence: 99%