Two-dimensional FTIR spectroscopic analysis of crystallization in cross-linked poly(ether ether ketone)

Lafi, Abdul G. Al; AL-Zier, A.; Allaf, A.W.

doi:10.1007/s12588-019-09254-3

Cited by 6 publications

(6 citation statements)

References 29 publications

(53 reference statements)

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“…With the increasing of the irradiation fluences, the intensity of all the characteristic absorption peaks gradually weakened and even disappeared. The absorbance of the ketone group (C=O) stretching vibration peaked at 1651 cm −1 , the aromatic skeletal vibration occurred at 1598, 1490 and 1413 cm −1 , the ether bond (C–O–C) was asymmetric stretching at 1280 and 1187 cm −1 , aromatic hydrogen in-plane deformation bands occurred at 1157 and 1103 cm −1 , the diphenyl ketone band occurred at 927 cm −1 and the plane bending modes of the aromatic hydrogens occurred at 860 and 841 cm −1 , which was consistent with the previous reports on this material [ 24 , 25 ]. Low-energy proton irradiation has a great effect on the molecular structure of PEEK materials.…”

Section: Resultssupporting

confidence: 91%

Study on the Microstructure of Polyether Ether Ketone Films Irradiated with 170 keV Protons by Grazing Incidence Small Angle X-ray Scattering (GISAXS) Technology

Yang

Tian

et al. 2020

Polymers

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Polyether ether ketone (PEEK) films irradiated with 170 keV protons were calculated by the stopping and ranges of ions in matter (SRIM) software. The results showed that the damage caused by 170 keV protons was only several microns of the PEEK surface, and the ionization absorbed dose and displacement absorbed dose were calculated. The surface morphology and roughness of PEEK after proton irradiation were studied by atomic force microscope (AFM). GISAXS was used to analyze the surface structural information of the pristine and irradiated PEEK. The experimental results showed that near the surface of the pristine and irradiated PEEK exists a peak, and the peak gradually disappeared with the increasing of the angles of incidence and the peak changed after irradiation, which implies the 170 keV protons have an effect on PEEK structure. The influences of PEEK irradiated with protons on the melting temperature and crystallization temperature was investigated by differential scanning calorimetry (DSC). The DSC results showed that the crystallinity of the polymer after irradiation decreased. The structure and content of free radicals of pristine and irradiated PEEK were studied by Fourier transform infrared spectroscopy (FTIR) and electron paramagnetic resonance (EPR). The stress and strain test results showed that the yield strength of the PEEK irradiated with 5 × 1015 p/cm2 and 1 × 1016 p/cm2 was higher than the pristine, but the elongation at break of the PEEK irradiated with 5 × 1015 p/cm2 and 1 × 1016 p/cm2 decreased obviously.

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Section: Resultssupporting

confidence: 91%

Study on the Microstructure of Polyether Ether Ketone Films Irradiated with 170 keV Protons by Grazing Incidence Small Angle X-ray Scattering (GISAXS) Technology

Yang

Tian

et al. 2020

Polymers

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“…This was in agreement with the literature [ 26 ], and indicated that orientation contributed more than the formation of crystal form II to the observed results. The results were also consistent with the reported FTIR studies of crystallization and proton irradiation effects on PEEK [ 32 , 40 ]. It has been shown that the relationship between the intensity ratio at 1310/1285 cm −1 and crystallization obeyed a linear dependence only when the degree of crystallization was higher than 15% [ 32 ].…”

Section: Discussionsupporting

confidence: 92%

“…The results were also consistent with the reported FTIR studies of crystallization and proton irradiation effects on PEEK [ 32 , 40 ]. It has been shown that the relationship between the intensity ratio at 1310/1285 cm −1 and crystallization obeyed a linear dependence only when the degree of crystallization was higher than 15% [ 32 ]. Both bands were observed to increase in intensity with increasing irradiation dose and were related to molecular chains orientation [ 40 ].…”

Section: Discussionsupporting

confidence: 92%

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Wide angle X-ray diffraction patterns and 2D-correlation spectroscopy of crystallization in proton irradiated poly(ether ether ketone)

Lafi

AL-Zier

Allaf

2021

Heliyon

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Proton irradiated poly (ether ether ketone) (PEEK) films were crystallized to different extents, and subsequently characterized by wide angle X-ray diffraction technique. The data were analyzed by two-dimensional correlation mapping (2D-CM), in particular: Generalized, hybrid and multiple perturbations correlation approaches. Two asynchronous correlation peaks at (19.1, 18.7) o and at (22.5, 19.1) o were utilized as a measure the crystal perfection and the preferred process; orientation/crystal growth respectively. Proton irradiation not only favored the formation of crystal form II, but also changed the type of orientation within the irradiated films. Differential scanning calorimetry and Raman spectroscopic analysis confirmed the contribution of the previous two factors. Raman spectra indicated that the intensity of both bands at 1595 and 1608 cm −1 decreased on samples crystallized from the melt, but increased on cold crystallized samples. 2D-CM combined with other suitable techniques is a promising in evaluating the structure of polymers and revealing the effect of proton irradiation.

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“…The figure shows that multiple characteristic absorption peak wavelength is located at 1730 cm À1 on behalf of the C¼O stretching vibration, located at 1492 cm À1 on behalf of the benzene ring carbon frame stretching vibration, located at 1225 cm À1 on behalf of the aromatic ether C-O symmetric stretching vibration. 25,26 This is attributable to the scission of C-H bonds and the following oxidation, which in turn destroys the chemically symmetrical structure. The FT-IR absorption measurement mainly detects the intramolecular vibrations of bonds.…”

Section: Ftir Analysismentioning

confidence: 99%

Influence of 25 MeV Si ions and 25 MeV O ions on the chemical and structural properties of PEEK films

Yang

2020

High Performance Polymers

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Poly (ether ether ketone) (PEEK) material can be used in a wide variety of fields, such as the aerospace, automotive, electronics, and nuclear industries. In this research, the irradiation effect of 25 MeV Si ions and 25 MeV O ions on the PEEK films was studied, focusing on the changes in chemical and structural properties. By analyzing surface morphology and microstructure evolution of the PEEK films after 25 MeV Si ion and 25 MeV O ion irradiation, particles were generated on surface of the PEEK after 25 MeV Si ion irradiation and black dots were generated on surface of the PEEK after 25 MeV O ion irradiation. The irradiation reduced the surface roughness of the PEEK films from the atomic force microscopy (AFM) results. The Fourier transform infrared (FTIR) results indicated that the groups and structure of the material were not changed by irradiation. The X-ray photoelectron spectroscopy (XPS) results showed that the contents of the chemical bonds C–C, C=O increased first and then decreased with the increasing of the fluences. The generated free radicals were observed by the electron paramagnetic resonance spectroscopy (EPR) at room temperature and the irradiation degradation mechanisms were analyzed. Thermal properties of the PEEK irradiated by 25 MeV O ions, indicating that a new secondary crystallization peak was found during the cooling stage. Consequently, the low fluences irradiation improves in the viscoelasticity and mechanical properties of PEEK films, while the high fluences irradiation reduces its performance.

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Two-dimensional FTIR spectroscopic analysis of crystallization in cross-linked poly(ether ether ketone)

Cited by 6 publications

References 29 publications

Study on the Microstructure of Polyether Ether Ketone Films Irradiated with 170 keV Protons by Grazing Incidence Small Angle X-ray Scattering (GISAXS) Technology

Study on the Microstructure of Polyether Ether Ketone Films Irradiated with 170 keV Protons by Grazing Incidence Small Angle X-ray Scattering (GISAXS) Technology

Wide angle X-ray diffraction patterns and 2D-correlation spectroscopy of crystallization in proton irradiated poly(ether ether ketone)

Influence of 25 MeV Si ions and 25 MeV O ions on the chemical and structural properties of PEEK films

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