2019 IEEE International Conference on Electrical, Computer and Communication Technologies (ICECCT) 2019
DOI: 10.1109/icecct.2019.8869264
|View full text |Cite
|
Sign up to set email alerts
|

Two Dimensional Analytical Modelling of DC IV Collapse of Drain Current in AlGaN/GaN HEMTs

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
2
1

Citation Types

0
5
0

Year Published

2020
2020
2024
2024

Publication Types

Select...
1
1

Relationship

1
1

Authors

Journals

citations
Cited by 2 publications
(5 citation statements)
references
References 10 publications
0
5
0
Order By: Relevance
“…where, ϑ (x) is the drift velocity of the electron and W G represents the gate width. The (ϑ -ε) relation [23] used in this model is given as:…”
Section: The Two-dimensional Analytical Modellingmentioning
confidence: 99%
See 4 more Smart Citations
“…where, ϑ (x) is the drift velocity of the electron and W G represents the gate width. The (ϑ -ε) relation [23] used in this model is given as:…”
Section: The Two-dimensional Analytical Modellingmentioning
confidence: 99%
“…where, µ is the mobility, ϑ s is the saturated velocity and ε is the electric field. The solution of the drain current [23] for the I-V characteristics can be found as:…”
Section: The Two-dimensional Analytical Modellingmentioning
confidence: 99%
See 3 more Smart Citations