Two-coordinate X-ray detector

Baru, S.E.; Proviz, G.I.; Savinov, G.A.; Sidorov, V.; Khabakhpashev, A.G.; Shuvalov, B.N.; Yakovlev, V. A.

doi:10.1016/0029-554x(78)90267-7

Cited by 14 publications

(4 citation statements)

References 3 publications

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“…Other multipole wigglers under development include a 27-period permanent magnet wiggler at SPEAR (Hoyer 1983) and a six-pole wiggler at CHESS (Batterman 1983).…”

Section: Light Multiplication and Wavelength Shiftingmentioning

confidence: 99%

Synchrotron X-radiation protein crystallography: instrumentation, methods and applications

Helliwell

1984

Rep. Prog. Phys.

134

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This review describes the utilisation of synchrotron x-radiation ( SR) in protein crystallography. For the general reader a brief discussion is given of the basics of protein structure analysis including an outline of the problems of sample radiation damage, the inherent weakness of individual reflections and the large amounts of data that need to be collected as well as the 'phase problem' of crystallography. The properties of synchrotron radiation emitted by relativistic electrons in simple circular orbits in bending magnets and by more sophisticated electron motions induced in wiggler or undulator magnets are discussed. The impact of newer high brightness synchrotron radiation sources in protein crystallography is assessed. The instrumentation required to monochromatise and focus the radiation onto typically small protein crystal samples and to detect the diffraction pattern is described. Both step scanning and energy dispersive techniques to optimise anomalous dispersion are covered. A gazetteer is given of the instruments providing data collection facilities for protein crystallography which are available on SR sources around the world. The modifications that are needed to standard data processing techniques are dealt with, taking account, for instance, of the position, angle and wavelength correlateable properties of photons incident to a sample from an SR source; properties which affect reflection prediction in both camera or diffractometer work.Applications of the high intensity and collimation are surveyed with specific examples given of data collection at high resolution, from large unit cells and small crystals as well as time-resolved crystallography. The use of the source tunability to optimise anomalous dispersion effects for metal-atom location and the phasing of individual reflections is discussed. Some case studies are given. The use of SR is speeding up the rate at which protein structures are being determined as well as their accuracy and will allow a more complete molecular anatomy of biological systems to be established.

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“…Other multipole wigglers under development include a 27-period permanent magnet wiggler at SPEAR (Hoyer 1983) and a six-pole wiggler at CHESS (Batterman 1983).…”

Section: Light Multiplication and Wavelength Shiftingmentioning

confidence: 99%

Synchrotron X-radiation protein crystallography: instrumentation, methods and applications

Helliwell

1984

Rep. Prog. Phys.

134

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Section: Introductionmentioning

confidence: 99%

“…Miyahara, Takahashi, Amemiya, Kamiya & Satow, 1986), multiwire proportional chambers (e.g. Baru et al, 1978), the FAST system (Bartunik & Borchert, 1989) and others (International Tables for Crystallography, 1992).Since it is the primary intention in this field to increase the speed of data collection, less attention is paid to the accuracy of a single measurement. Only one attempt (Sakamaki, Hosoya & Fukamachi, 1980) has been made to incorporate the Laue technique into an ordinary four-circle-diffractometer device.…”

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confidence: 99%

Single-crystal data collection with a Laue diffractometer

Lange¹,

Burzlaff²

1995

Acta Cryst Sect A

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The Laue technique is suitable to study effects that depend on wavelength such as absorption, anomalous dispersion or secondary extinction. The accuracy of the measured integrated intensities for X-ray structure determination is comparable with measurements of conventionally collected data. The present paper describes and discusses the results of a single-crystal data collection with a Laue diffractometer. The results obtained from the Laue data are in very good agreement with the results from conventionally collected data. IntroductionThe availability of synchrotrons as white-radiation X-ray sources of high spectral brilliance is the reason for recent developments in Lane diffraction techniques for data collection, especially in the field of protein crystallography. Several two-dimensional detector systems are in use, such as films (e.g. Rabinovich & Lourie, 1987), image plates (e.g. Miyahara, Takahashi, Amemiya, Kamiya & Satow, 1986), multiwire proportional chambers (e.g. Baru et al., 1978), the FAST system (Bartunik & Borchert, 1989) and others (International Tables for Crystallography, 1992).Since it is the primary intention in this field to increase the speed of data collection, less attention is paid to the accuracy of a single measurement. Only one attempt (Sakamaki, Hosoya & Fukamachi, 1980) has been made to incorporate the Laue technique into an ordinary four-circle-diffractometer device. The present authors reported in a series of short communications on the hardware development of devices suitable for this purpose (Lange & Burzlaff, 1991a,b).It is the intention of this paper to report first results on the basis of a medium-sized inorganic structure, to compare the data with a data set collected in the classical way and to discuss the results and the technique in comparison with the work of Sakamaki et al. Measurement of integrated intensitiesSingle-crystal X-ray diffraction with white radiation differs from the monochromatic technique in the following ways:1. Instead of one well defined Ewald sphere with radius R = l/A, a continuous distribution of Ewald spheres with Rmin ~ R < Rmax is present resulting in a simultaneous diffraction process for a large number of reciprocal-lattice vectors hi. Each vector hi selects its own Ewald sphere depending on its position in the reciprocal space.For the simultaneous registration of the reflections, a two-dimensional detector is necessary that allows the angular localization of the diffracted beams. In addition, the wavelength distribution within the diffracted beam has to be known. Approximately 17% (Cruickshank, Helliwell & Moffat, 1987) of all diffracted beams contain a series of nA related to the scattering vectors nh of the reflection (n = 1, 2, 3 .... ).2. In contrast to the conventional monochromatic technique, a property of the crystal is utilized in another way. With the model for a real crystal composed of small mosaic blocks, the end point of the scattering vector h must be replaced by a small fragment of a spherical surface. Its shape is d...

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“…Individual-amplifier-per-wire read-out systems have been described by Faruqi & Bond (1982) and by Hendrix, Fuerst, Hartfiel & Dainton (1982) for straight LPSDs and by Pernot, Kahn, Fourme, Leboucher, Million, Santiard & Charpak (1982) for curved LPSDs. Two-dimensional MWPCs of this type (Baru, Proviz, Savinov, Sidorov, Khabakhpashev, Shuvalov & Yakovlev, 1978) have been employed in the single-crystal diffractometer of Mokulskaya, Kuzev, Myshko, Khrenov, Mokulskii, Dobrokhotova, Volodenkov, Rubanov, Ryanzina, Shitikov, Baru, Khabakhpashev & Sidorov (1981). Two versions of a high-resolution spherical-drift-chamber MWPC with individual wire read-out have been described by Kahn, Fourme, Bosshard, Caudron, Santiard & Charpak (1982) and Kahn, Fourme, Bosshard & Saintagne (1986).…”

Section: Localization Of the Detected Photonmentioning

confidence: 99%

X-ray position-sensitive detectors

Arndt¹

1986

J Appl Cryst

118

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The physical processes are examined which can be used for the detection of X-rays in the range between about 3 and about 20keV and for the positional localization of the incident photons. The criteria for choosing a detector for particular purposes are discussed in general terms. Specific examples of one-and two-dimensional detectors are then considered with particular emphasis on devices which are still in a state of development, and an attempt is made to summarize the nature, performance and suitability for different experiments of available detectors.

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Two-coordinate X-ray detector

Cited by 14 publications

References 3 publications

Synchrotron X-radiation protein crystallography: instrumentation, methods and applications

Synchrotron X-radiation protein crystallography: instrumentation, methods and applications

Single-crystal data collection with a Laue diffractometer

X-ray position-sensitive detectors

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