2013
DOI: 10.1117/1.oe.52.10.101909
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Two approaches to the blind phase shift extraction for two-step electronic speckle pattern interferometry

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Cited by 23 publications
(10 citation statements)
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“…Being reflected from the testing object 5 and the refer-ence mirror 7, these two beams again fall on the light splitter 4, after which they propagate in one direction to camera 8. With the help of camera 8 and computer 11, the result of the coherent interaction of these beams is recorded, i.e., the speckle interferograms (SI) of the surface of the LCM [13,17,18].…”
Section: Acoustic Resonance In a Hidden Defectmentioning
confidence: 99%
“…Being reflected from the testing object 5 and the refer-ence mirror 7, these two beams again fall on the light splitter 4, after which they propagate in one direction to camera 8. With the help of camera 8 and computer 11, the result of the coherent interaction of these beams is recorded, i.e., the speckle interferograms (SI) of the surface of the LCM [13,17,18].…”
Section: Acoustic Resonance In a Hidden Defectmentioning
confidence: 99%
“…Deng et al (2012) proposed a phase shift extraction algorithm based on calculating the extreme value of interference (EVI) in the interferogram, by searching for the ratio of the extreme values of interference in one interferogram to another interferogram, the phase shift between two interferograms and the measured phase can be determined accurately. Muravsky et al (2011) proposed a two-step algorithm to determine the phase shift by the correlation coefficient of two interferograms (Muravsky and Voronyak 2013). Though almost all of these two-step algorithms are required to eliminate the background of interferograms in advance, it still is a good choice to perform the phase shift extraction with these algorithms because of their convenience, practicability and requirement of fewer frames.…”
Section: Introductionmentioning
confidence: 99%
“…Methods of two-and three-step phase shifting interferometry (PSI) with arbitrary unknown phase shifts (UPSs) between interferograms are becoming very popular due to their simplicity and processing speed. The efforts to simplify and accelerate the retrieval of surface displacement and strain fields by using methods of two-and three-step phase shifting (PS) digital speckle pattern interferometry (DSPI) with UPSs have also been made [1][2][3]. Previous results of computer simulations showed that the absolute errors of UPSs decrease with an increase in the surface roughness of the studied object [2].…”
Section: Introductionmentioning
confidence: 99%
“…The efforts to simplify and accelerate the retrieval of surface displacement and strain fields by using methods of two-and three-step phase shifting (PS) digital speckle pattern interferometry (DSPI) with UPSs have also been made [1][2][3]. Previous results of computer simulations showed that the absolute errors of UPSs decrease with an increase in the surface roughness of the studied object [2]. However, in these simulations, calculations of UPSs were performed for speckle fringe patterns (SFPs) containing background intensity distributions.…”
Section: Introductionmentioning
confidence: 99%