2019 41st Annual EOS/ESD Symposium (EOS/ESD) 2019
DOI: 10.23919/eos/esd.2019.8869992
|View full text |Cite
|
Sign up to set email alerts
|

TVS Devices Transient Behavior Modeling Framework and Application to SEED

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2

Citation Types

0
2
0

Year Published

2020
2020
2023
2023

Publication Types

Select...
3
3

Relationship

0
6

Authors

Journals

citations
Cited by 9 publications
(2 citation statements)
references
References 10 publications
0
2
0
Order By: Relevance
“…One of the most related problems is to develop models with a sufficient accuracy considering the dynamic behavior, such as the protection device's triggering behavior to obtain a good estimation of the overvoltages [16], [17], [18], [19], [20]. Papers generally propose Simulation Program with Integrated Circuit Emphasis (SPICE)-like models to address this issue.…”
Section: Introductionmentioning
confidence: 99%
See 1 more Smart Citation
“…One of the most related problems is to develop models with a sufficient accuracy considering the dynamic behavior, such as the protection device's triggering behavior to obtain a good estimation of the overvoltages [16], [17], [18], [19], [20]. Papers generally propose Simulation Program with Integrated Circuit Emphasis (SPICE)-like models to address this issue.…”
Section: Introductionmentioning
confidence: 99%
“…A conventional measurement technique to characterize protection devices without damaging the devices is the TLP. Using this generator, some authors have proposed dynamic models for protection devices [17], [18], [19], [20], [21]. The model extraction is based on measurements using both voltage and current probes, which are frequency limited.…”
Section: Introductionmentioning
confidence: 99%