2021
DOI: 10.1103/physrevb.104.054508
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Tunneling study in granular aluminum near the Mott metal-to-insulator transition

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Cited by 6 publications
(1 citation statement)
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“…Thin films with a thickness of 40-60 nm were thermally evaporated on R-plane sapphire substrates held at liquid nitrogen temperature (samples A-C), similar to previous works. 23,24 An additional device made on a substrate held at room temperature was investigated for comparison (sample D). A Hall bar or a square sample deposited simultaneously was used to assess the quality of the thin films.…”
mentioning
confidence: 99%
“…Thin films with a thickness of 40-60 nm were thermally evaporated on R-plane sapphire substrates held at liquid nitrogen temperature (samples A-C), similar to previous works. 23,24 An additional device made on a substrate held at room temperature was investigated for comparison (sample D). A Hall bar or a square sample deposited simultaneously was used to assess the quality of the thin films.…”
mentioning
confidence: 99%