“…No consistent change in the lattice parameter, a 0 , or in high angle line width with annealing for 2 weeks at 750°C is evident, i.e., in contrast to the behavior observed [3] in UCu 5Àx Pd x . Although, as reported in [1], there are slight, $5%, changes in the specific heat with annealing, there is no evidence that annealing at 750°C for 2 weeks affects the order of the sample, evidenced either through changes in the lattice parameter or through measurement of the width of the high angle X-ray diffraction lines. For example, the [731] line centered at approximately 115.9°2H for the UCu 4 Ni sample shows the same line width for both unannealed and annealed samples; this is in contrast to the observed [3] sharpening of even a relatively low angle diffraction line (at 42.4°2H) in UCu 4 Pd under the same annealing treatment by 20%.…”