2017
DOI: 10.1039/c6nr08467b
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Tunable electrical properties of multilayer HfSe2field effect transistors by oxygen plasma treatment

Abstract: HfSe field effect transistors are systematically studied in order to selectively tune their electrical properties by optimizing layer thickness and oxygen plasma treatment. The optimized plasma-treated HfSe field effect transistors showed a high on/off ratio improvement of four orders of magnitude, from 27 to 10, a field effect mobility increase from 2.16 to 3.04 cm V s, a subthreshold swing improvement from 30.6 to 4.8 V dec, and a positive threshold voltage shift between depletion mode and enhancement mode, … Show more

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Cited by 43 publications
(55 citation statements)
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“…Both AFM and scanning electron microscopy (SEM) images (Figure S1, Supporting Information) show that the surface of HfSe 2 layer is rather smooth and uniform, and the root‐mean‐square (RMS) roughness determined from the AFM image is only 0.48 nm. Two characteristic Raman‐active modes of 145.8 and 198.2 cm −1 are observed in Figure e, which are in good agreement with the previously reported results of HfSe 2 . The 145.8 cm −1 peak is attributed to the E g mode, corresponding to the in‐plane vibration of Hf and Se atoms, while the 198.2 cm −1 one is the A 1g mode, arising from the out‐of‐plane vibration of Se atoms.…”
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confidence: 90%
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“…Both AFM and scanning electron microscopy (SEM) images (Figure S1, Supporting Information) show that the surface of HfSe 2 layer is rather smooth and uniform, and the root‐mean‐square (RMS) roughness determined from the AFM image is only 0.48 nm. Two characteristic Raman‐active modes of 145.8 and 198.2 cm −1 are observed in Figure e, which are in good agreement with the previously reported results of HfSe 2 . The 145.8 cm −1 peak is attributed to the E g mode, corresponding to the in‐plane vibration of Hf and Se atoms, while the 198.2 cm −1 one is the A 1g mode, arising from the out‐of‐plane vibration of Se atoms.…”
supporting
confidence: 90%
“…Similarly, Figure h shows two peaks at 53.3 and 54.2 eV representing the Se 3d 5/2 and Se 3d 3/2 core levels. All of these features are consistent with the reported values for HfSe 2 crystal . Moreover, the atomic ratio between Hf and Se obtained from the integrated peak areas is 1:1.96, suggesting that our CVD‐grown HfSe 2 possesses reasonably good stoichiometry.…”
supporting
confidence: 90%
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