2006
DOI: 10.1063/1.2234844
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Tritiation of amorphous and crystalline silicon using T2 gas

Abstract: Degradation in photocatalytic activity induced by hydrogen-related defects in nano-Li Nb O 3 material

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Cited by 13 publications
(17 citation statements)
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References 10 publications
(6 reference statements)
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“…2,17,18 The LT peaks suggest the existence of high order silicon tritides and tritium clusters, and the HT peak could be attributed predominantly to the Si-T monotritide bonds. 12,17 By comparing the fractional areas under both HT and LT peaks, it is estimated that around 70% of the tritium in a-Si:H films exists in the form of high order silicon tritides and tritium cluster. Despite identical tritium loading conditions and similar effusion profiles, the tritium concentrations in the three samples are significantly different.…”
Section: A Tritium Contentsmentioning
confidence: 99%
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“…2,17,18 The LT peaks suggest the existence of high order silicon tritides and tritium clusters, and the HT peak could be attributed predominantly to the Si-T monotritide bonds. 12,17 By comparing the fractional areas under both HT and LT peaks, it is estimated that around 70% of the tritium in a-Si:H films exists in the form of high order silicon tritides and tritium cluster. Despite identical tritium loading conditions and similar effusion profiles, the tritium concentrations in the three samples are significantly different.…”
Section: A Tritium Contentsmentioning
confidence: 99%
“…Here silicon following its synthesis was tritiated by directly exposing it to tritium gas (T 2 ) at elevated temperature. 12,15 These studies suggest that tritium can be readily and locally integrated on-chip using a "post-process" tritiation procedure, for example, implemented after the fabrication of MEMS and microelectrical devices, and thus offering a clean and versatile method to integrate radioactive fuel on-chip.…”
Section: Introductionmentioning
confidence: 99%
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“…2,4,7,8 Tritium is a pure beta emitter producing energetic electrons with an average energy of 5.7 keV and a maximum energy of 18.6 keV. Considering that the threshold electron energy for disruption of the silicon lattice due to knock-on collisions is 20 keV, 9 tritium decay beta particles pose little radiation damage concern for on-chip energy conversion devices.…”
mentioning
confidence: 99%