Trends in radiation susceptibility of commercial DRAMs for space systems

Miller, Chris; Owen, Russ; Rose, M.; Rutt, Paul M.; Schaefer, Justin J.; Troxel, Ian A.

doi:10.1109/aero.2009.4839511

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2009

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“…This report examines 64 Mb, 128 Mb, and 256 Mb DRAM on-orbit upset rates and compares those rates to bounding predictions made using CREME96. This analysis is part of an ongoing SEAKR program to better understand the correlation between predicted and actual upset rates in space systems [5]. Upon evaluation of actual space weather data the models are shown to be slightly conservative.…”

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confidence: 99%

Observations from the Analysis of On-Orbit Data from DRAMs Used in Space Systems

Schaefer

Owen

Rutt

et al. 2009

2009 IEEE Radiation Effects Data Workshop

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Radiation effects such as TID and SEE including single and multiple bit upsets and SEFI modes need to be characterized and considered for space systems using COTS DRAM for natural space radiation environments. We present on-orbit data collected from commercial DRAM devices used in SSRs designed and built by SEAKR Engineering. Upset rates for on-orbit COTS DRAM memories are presented and compared to rates predicted using CREME96 [1] for three generations of commercial DRAM technology including 64 Mb EDO DRAM, 128 Mb SDRAM, and 256 Mb SDRAM. 1

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confidence: 99%