2010
DOI: 10.1088/0953-8984/22/8/084017
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Trends in low energy electron microscopy

Abstract: Low energy electron microscopy (LEEM) and spin polarized LEEM (SPLEEM) are two powerful in situ techniques for the study of surfaces, thin films and other surface-supported nanostructures. Their real-time imaging and complementary diffraction capabilities allow the study of structure, morphology, magnetism and dynamic processes with high spatial and temporal resolution. Progress in methods, instrumentation and understanding of novel contrast mechanisms that derive from the wave nature and spin degree of freedo… Show more

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Cited by 84 publications
(79 citation statements)
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“…The LEED intensityvoltage (I -V ) curves were measured in a low-energy electron microscope operated in diffraction mode, corresponding to normal incidence. 17 The experimental data presented in Fig. 2 were obtained with the sample held at 83 K. Measurements that were carried out at 300 K produced almost identical results, except for strong suppression of diffraction intensities above about 150 eV due to the Debye-Waller effect.…”
Section: Methodsmentioning
confidence: 79%
“…The LEED intensityvoltage (I -V ) curves were measured in a low-energy electron microscope operated in diffraction mode, corresponding to normal incidence. 17 The experimental data presented in Fig. 2 were obtained with the sample held at 83 K. Measurements that were carried out at 300 K produced almost identical results, except for strong suppression of diffraction intensities above about 150 eV due to the Debye-Waller effect.…”
Section: Methodsmentioning
confidence: 79%
“…In this mode, image contrast is sensitive to surface defects and changes in work function. [19,20] After Ar-ion sputtering, the surface is featureless except for a low density of defects as seen in Fig. 1(a).…”
Section: Methodsmentioning
confidence: 99%
“…LEED measurements of the ͑00͒ beam at normal incidence, corresponding to no momentum transfer parallel to the surface, were performed in a low-energy electron microscope ͑LEEM͒. 24,25 These new LEED data are presented here in comparison to results of LEEM-image intensity measurements that were obtained previously for the same diffraction condition ͓Fig. 1͑a͔͒.…”
Section: A Experimental Detailsmentioning
confidence: 96%