2017
DOI: 10.1016/j.optlastec.2017.06.025
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Trapping two types of particles using a focused partially coherent circular edge dislocations beam

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Cited by 13 publications
(8 citation statements)
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“…In addition, the range of acceptable radii for the stable capture of the low index of refraction particles was determined. In comparison with the previous work, the focused partially coherent circular edge dislocations beam can be used to trap the high index of refraction particles at the focus F, and simultaneously to capture the low index of refraction particles at a dark ring [21], whereas the focused GSM vortex beam can trap the low index of refraction particles to the z-axis, thus, the trapping range of the same kind of particles is different obviously for different beams. The results obtained in this paper provide valuable information for trapping and manipulating Rayleigh particles using GSM vortex beams, which may be applied in biotechnology, nanotechnology and other fields.…”
Section: Discussionmentioning
confidence: 98%
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“…In addition, the range of acceptable radii for the stable capture of the low index of refraction particles was determined. In comparison with the previous work, the focused partially coherent circular edge dislocations beam can be used to trap the high index of refraction particles at the focus F, and simultaneously to capture the low index of refraction particles at a dark ring [21], whereas the focused GSM vortex beam can trap the low index of refraction particles to the z-axis, thus, the trapping range of the same kind of particles is different obviously for different beams. The results obtained in this paper provide valuable information for trapping and manipulating Rayleigh particles using GSM vortex beams, which may be applied in biotechnology, nanotechnology and other fields.…”
Section: Discussionmentioning
confidence: 98%
“…(1) reduces to the initial field of a fundamental Gaussian beam and for m ≠ 0 and n = 0, Eq. (1) degenerates to the initial field distribution of a vortex beam [21].…”
Section: Theoretical Modelmentioning
confidence: 99%
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“…Previous results suggest that a focused pseudo-Schell model beam could be used for trapping dielectric nanoparticles in a similar way to other kinds of partially coherent beams [5,6,[34][35][36][37]. An advantage of the pseudo-Schell model beams is the sharpening of the intensity profile and the high peak that is reached after the source plane (see Figures 5 and 6), which could increase the gradient force exerted on a dielectric particle.…”
Section: Trapping Dielectric Nanoparticle With Pseudo-schell Beamsmentioning
confidence: 90%
“…The introduction of NUTP beams has been followed by their use in numerous application fields, such as optical tweezers, particle optical manipulation, material processing, microscopy, focus shaping, surface plasmon sensing, polarimetry, etc. [10,12,13,25,44,[52][53][54][55][56][57][58][59][60][61][62][63][64][65][66][67][68][69][70].…”
Section: Introductionmentioning
confidence: 99%