1993
DOI: 10.1007/bf00567609
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Trap mutation in He-doped ion-implanted tungsten

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Cited by 24 publications
(11 citation statements)
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“…During annealing, single Ar atoms were observed to migrate from areas of a low concentration of Ar to areas of higher concentration. Usually the resulting clusters consisted of interstitial atoms but in a few cases there was evidence of a trap mutation mechanism [33] where a lattice atom is ejected as an interstitial and is replaced by a gas atom; this only occurs when a cluster reaches a size containing at least 6 Ar atoms. The consequence of this is that large clusters can become 'pinned' to their location since substitutional Ar atoms are more strongly bound.…”
Section: (Ii) Annealing Simulationsmentioning
confidence: 99%
“…During annealing, single Ar atoms were observed to migrate from areas of a low concentration of Ar to areas of higher concentration. Usually the resulting clusters consisted of interstitial atoms but in a few cases there was evidence of a trap mutation mechanism [33] where a lattice atom is ejected as an interstitial and is replaced by a gas atom; this only occurs when a cluster reaches a size containing at least 6 Ar atoms. The consequence of this is that large clusters can become 'pinned' to their location since substitutional Ar atoms are more strongly bound.…”
Section: (Ii) Annealing Simulationsmentioning
confidence: 99%
“…It is generally agreed that the formation of a bubble can present areas of high strain fields and can easily initiate a failure by embrittlement or stress cracking. The common character of the several mechanisms proposed for the formation of H and He bubbles is that vacancy-hydrogen and vacancy-helium clusters can grow to form H and He bubbles, respectively [31][32][33]. However, a vacancy-hydrogen (-helium) cluster decomposes with increasing temperature [17,33].…”
Section: Introductionmentioning
confidence: 99%
“…Those events have been evidenced in MD simulations by many authors [34][35][36] and are favored by the potentials used for these MD simulations.…”
mentioning
confidence: 75%