2011
DOI: 10.1103/physrevb.84.115444
|View full text |Cite
|
Sign up to set email alerts
|

Transport measurements on carbon nanotubes structurally characterized by electron diffraction

Abstract: A technique for the structural and electronic characterization of the same individual single wall carbon nanotube is presented. Electron diffraction was performed on carbon nanotubes grown across a perforated silicon nitride film and the chiral indices of individual tubes were determined. By means of a scanning-probe-based nanomanipulator a selected tube was then placed in the desired location across prepatterned electrodes. After patterning further electrodes on-top of the tube electronic transport measuremen… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

0
7
0

Year Published

2013
2013
2016
2016

Publication Types

Select...
3
1

Relationship

0
4

Authors

Journals

citations
Cited by 4 publications
(7 citation statements)
references
References 41 publications
(54 reference statements)
0
7
0
Order By: Relevance
“…A few experiments have combined transport measurements with structure determination by electron diffraction (Kociak et al, 2002;Allen et al, 2011). The structure can also be determined using optical Raman or Rayleigh spectroscopy, which is less invasive but does not always give unambiguous chiral indices (Cao et al, 2004;Huang et al, 2005;Deshpande et al, 2009).…”
Section: Basics Of Carbon Nanotube Devices a Structure Of Carbonmentioning
confidence: 99%
“…A few experiments have combined transport measurements with structure determination by electron diffraction (Kociak et al, 2002;Allen et al, 2011). The structure can also be determined using optical Raman or Rayleigh spectroscopy, which is less invasive but does not always give unambiguous chiral indices (Cao et al, 2004;Huang et al, 2005;Deshpande et al, 2009).…”
Section: Basics Of Carbon Nanotube Devices a Structure Of Carbonmentioning
confidence: 99%
“…The chirality of electrically contacted nanotubes is assigned by electron diffraction, (16,5)@ (20,12) as demonstrated by others [19][20][21]. However, here nanotubes are embedded in complex MEM actuators.…”
Section: Related Workmentioning
confidence: 67%
“…The nanotube integration is resist-free and electron-beam-induced contaminations [21] are avoided during assembly.…”
Section: Related Workmentioning
confidence: 99%
“…Performing diffraction studies within a transmission electron microscope has become arguably by far the most powerful technique for the accurate determination of the chirality of individual SWCNTs, and ED methods are widely used to identify certain SWCNTs . For example, Jourdain and co‐workers observed the atomic structure of ultra‐long carbon nanotubes along the nanotube length via electron diffraction .…”
Section: Practical Examplesmentioning
confidence: 99%