Transport and noise characteristics of submicron high-temperature superconductor grain-boundary junctions

Herbstritt, F.; Kemen, T.; Alff, Lambert; Marx, Achim; Gross, Rudolf

doi:10.1063/1.1343847

Cited by 28 publications

(27 citation statements)

References 19 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…They depend on growth conditions and bicrystal surface quality, being modeled by (5) by an extended gap smearing in Fig. 1(b), e.g., by [4], [7], [8], [16]- [19] and from percolation analysis [9]. The j R data of YBCO from [10] are indicated as crosses and the 45 natural junction and their changes with O-doping as solid circles following c = c [7].…”

Section: Resultsmentioning

confidence: 99%

“…Similar degradations of , of and of , as compared to , to and to , are found for all HTSs, indicating that degradations are specific to cuprate planes independent of adjacent cations. New insights into degradations are supplied by hole and impurity doping [7], [8], by noise measurements [9], by rf residual losses [10], by interface engineered junctions (IEJ), by Mott insulator considerations, and by structural considerations, which all are modeled together successfully in Sections III and IV [11]- [19]. The result leads the way out of this interface deadlock, i.e., how to avoid the transition to a Mott insulator seam with its /cm , being two orders of magnitude larger than of Nb/Nb O and four orders for Nb/AlO (OH) tunnel barriers [14], [15].…”

Section: Introductionmentioning

confidence: 99%

See 1 more Smart Citation

Physics of HTS natural, artificial and interface engineered junctions

Halbritter

2003

IEEE Trans. Appl. Supercond.

View full text Add to dashboard Cite

In highsuperconductors, being layered, doped Mott insulators, in-plane weak links occur easily in preparation and in growth, and are prone to deteriorate further. CuO-plane weak links are the major obstacles for HTS transport currents, both dc and rf. Weak links are tunnel junctions showing reduced critical Josephson currents (A/cm 2 ), enhanced normal (cm 2 ) and leakage resistances ( ) , where the degradation of 1 is specific to HTS. The ease of occurrence of weak links and their degradations are consequences of the transition to a Mott-insulator seam by reduced wave function overlap at surfaces, by underdoping, and by spatial or bonding disorder. The degradations show up in exp( 2 ), in (1 10 )exp( ), and in 2 2 = 10 12 Vcm 2 for all NCCO, YBCO, BSCCO, and TBCCO junctions grown naturally or artificially to date, with 0 2 nm as tunnel barrier width of height 2 eV, and with 10 21 /cm 3 localized states causing 1 . For the first time their , and 2 degradations are quantified by the resonant tunnel model, even for interface engineered junctions (IEJ), in agreement with experimental data. Comparison of HTS junctions with Nb/Nb 2 O 5 and Nb/Al/AlO (OH) junctions shows ways out of the interface chemistry deadlock.

show abstract

Section: Resultsmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Physics of HTS natural, artificial and interface engineered junctions

Halbritter

2003

IEEE Trans. Appl. Supercond.

View full text Add to dashboard Cite

show abstract

“…Neat fingerprints of the resistively and capacitively shunted junction ͑RCSJ͒ model are found. The results add novel information to the few studies realized on submicron HTS junctions, mostly bicrystal, available in literature, [11][12][13][14] and give promise of a new generation of competitive deep-submicron GB HTS JJs.…”

Section: Introductionmentioning

confidence: 93%

Submicron YBaCuO biepitaxial Josephson junctions: d-wave effects and phase dynamics

Stornaiuolo

Rotoli

Cedergren

et al. 2010

Journal of Applied Physics

View full text Add to dashboard Cite

We report a systematic study of the transport properties of high critical temperature superconductor ͑HTS͒ biepitaxial Josephson junctions in the submicron range. Junction performances point to more uniform and reproducible devices and to better control of d-wave intrinsic properties. Outcomes promote novel insights into the transport mechanisms across grain boundaries and encourage further developments in the control of dissipation in HTS devices. The application of nanotechnology to HTS could be an additional tool to properly engineer the junction properties to match specific circuit design also in view of the integration into hybrid quantum circuits.

show abstract

“…To understand the nature of these processes it is interesting to investigate the junctions containing a small number of LS that can be realized by decreasing the area of the weak link of a junction. In the case of planar HTS junctions on bicrystal substrates it is implemented by reduction of junction width down to submicron values [5]. Application of bicrystal substrates for fabrication of HTS Josephson junctions and SQUIDs is the most acceptable way to obtain the reproducible and controllable parameters of last ones [6].…”

Section: Introductionmentioning

confidence: 99%

YBa/sub 2/Cu/sub 3/O/sub X/ submicron Josephson junctions on bicrystal substrates

Волков

Chuharkin

Снигирев

et al. 2003

IEEE Trans. Appl. Supercond.

View full text Add to dashboard Cite

A technological process based on e-beam lithography and ion beam etching of YBa 2 Cu 3 O (YBCO) film through carbon mask is applied to fabricate a series of YBCO dc SQUIDs on SrTiO 3 30 -bicrystal substrates. The width of Josephson junctions used in SQUIDs ranges from 0.6 m to 1 m. The character of the temperature dependence of the junctions critical current enables one to confirm the realization of d-wave pairing mechanism as well as the presence of localized states in the grain boundary region. The diffraction pattern of submicron junctions is discussed in relation to their further application in SQUIDs for task of scanning SQUID microscopy in high magnetic fields.

show abstract

Transport and noise characteristics of submicron high-temperature superconductor grain-boundary junctions

Abstract: Articles you may be interested inMechanisms for enhanced supercurrent across meandered grain boundaries in high-temperature superconductors

Cited by 28 publications

References 19 publications

Physics of HTS natural, artificial and interface engineered junctions

Physics of HTS natural, artificial and interface engineered junctions

Submicron YBaCuO biepitaxial Josephson junctions: d-wave effects and phase dynamics

YBa/sub 2/Cu/sub 3/O/sub X/ submicron Josephson junctions on bicrystal substrates

Contact Info

Product

Resources

About