Transparent semiconductor zinc oxide thin films deposited on glass substrates by sol–gel process

Tsay, Chien Yie; Fan, Kai; Wang, Yu-Wu; Chang, Chi‐Jung; Tseng, Yung Kuan; Lin, Chung Kwei

doi:10.1016/j.ceramint.2010.03.005

Cited by 79 publications

(20 citation statements)

References 32 publications

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“…As noted above, we collected a large number of published Tauc analyses of undoped ZnO that included plots of the absorbance data against the photon energy . This was critical, as our assessment of the application of the Tauc method required the consistent application of a fitting method, as described below.…”

Section: Modelmentioning

confidence: 99%

Evaluation of the Tauc method for optical absorption edge determination: ZnO thin films as a model system

Viezbicke

Patel

Davis

et al. 2015

Phys. Status Solidi B

887

419

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One of the most frequently used methods for characterizing thin films is UV–Vis absorption. The near‐edge region can be fitted to a simple expression in which the intercept gives the band‐gap and the fitting exponent identifies the electronic transition as direct or indirect (see Tauc et al., Phys. Status Solidi 15, 627 (1966); these are often called “Tauc” plots). While the technique is powerful and simple, the accuracy of the fitted band‐gap result is seldom stated or known. We tackle this question by refitting a large number of Tauc plots from the literature and look for trends. Nominally pure zinc oxide (ZnO) was chosen as a material with limited intrinsic deviation from stoichiometry and which has been widely studied. Our examination of the band gap values and their distribution leads to a discussion of some experimental factors that can bias the data and lead to either smaller or larger apparent values than would be expected. Finally, an easily evaluated figure‐of‐merit is defined that may help guide more accurate Tauc fitting. For samples with relatively sharper Tauc plot shapes, the population yields Eg(ZnO) as 3.276 ± 0.033 eV, in good agreement with data for single crystalline material.

show abstract

Section: Modelmentioning

confidence: 99%

Evaluation of the Tauc method for optical absorption edge determination: ZnO thin films as a model system

Viezbicke

Patel

Davis

et al. 2015

Phys. Status Solidi B

887

419

View full text Add to dashboard Cite

show abstract

“…ZnO can be used for many applications, such as photocatalysts [1], transparent conducting layer [2], photoconductor [3], and gas sensors [4,5]. ZnO based photocatalysts have attracted much attention due to their applications in decolorization of hazardous pollutants such as dyes, chemicals, and toxic gases.…”

Section: Introductionmentioning

confidence: 99%

Ag-doped ZnO nanorods coated metal wire meshes as hierarchical photocatalysts with high visible-light driven photoactivity and photostability

Hsu

Chang

2014

Journal of Hazardous Materials

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147

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“…Tsay et al [14] indicated that the ZnO films synthesized with the low boiling point solvent showed smaller average crystallite sizes than those films synthesized using 2-methoxyethanol. In the present work this is only observed for the samples with lower concentration of the precursor.…”

Section: Microstructure Of Zno Filmsmentioning

confidence: 98%

Nanocrystalline ZnO Thin Films – Influence of Sol-gel Conditions on the Underlying Chemistry and Film Microstructure and Transparency

Maia

Ochoa

Portugal

et al. 2015

Materials Today: Proceedings

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Transparent semiconductor zinc oxide thin films deposited on glass substrates by sol–gel process

Cited by 79 publications

References 32 publications

Evaluation of the Tauc method for optical absorption edge determination: ZnO thin films as a model system

Evaluation of the Tauc method for optical absorption edge determination: ZnO thin films as a model system

Ag-doped ZnO nanorods coated metal wire meshes as hierarchical photocatalysts with high visible-light driven photoactivity and photostability

Nanocrystalline ZnO Thin Films – Influence of Sol-gel Conditions on the Underlying Chemistry and Film Microstructure and Transparency

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