“…As shown in Figure a, the diffraction peaks detected at 2θ = 31.8, 34.4, 36.2, 47.5, 56.6, 62.9, and 68.0° correspond to the (100), (002), (101), (102), (110), (103) and (112) planes of ZnO, respectively . It can be observed that the positions of the diffraction peaks for all three samples were in precise accordance with the standard card of hexagonal wurtzite ZnO (JCPDS 36-1451) . No other impurity peaks were detected, demonstrating the high purity of the synthesized samples.…”