Transmission Structured Illumination Microscopy for Quantitative Phase and Scattering Imaging

Wen, Kai; Ma, Ying; Liu, Min; Li, Jianlang; Zalevsky, Zeev; Zheng, Juanjuan

doi:10.3389/fphy.2020.630350

Cited by 5 publications

(3 citation statements)

References 35 publications

(37 reference statements)

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“…In the second experiment, the method is tested under an optical microscope, which is similar to the arrangement of a transmission structured illumination microscope. 45 Their experimental setups are illustrated in Figs. 7(a) and 7(b), respectively.…”

Section: Methodsmentioning

confidence: 99%

Toward robust super-resolution imaging: A low-rank approximation approach for pattern-illuminated Fourier ptychography

Zhang,

Wei,

Yang

et al. 2024

APL Photonics

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Pattern-illuminated Fourier ptychography (piFP) is an elegant combination of structured illumination imaging and a Fourier ptychographic algorithm with the ability to image beyond the diffraction limit of the employed optics. Artifact-free piFP super-resolution reconstruction requires a high level of stability in the illumination pattern. However, unpredictable pattern variation occurs in the presence of environment perturbation, intensity fluctuation, and pointing instability at the source, leading to declines in image reconstruction quality. To address this issue, we present an efficient and robust piFP algorithm based on low-rank approximation (LRA-piFP), which relaxes the requirement for the stability of illumination patterns. This LRA-piFP method can model frame-wise pattern variation during a full scan, thus improve the reconstruction quality significantly. We take numerical simulations and proof-of-principle experiments with both long-range imaging and microscopy for demonstrations. Results show that the LRA-piFP method can handle different kinds of pattern variation and outperforms other state-of-the-art techniques in terms of reconstruction quality and resolution improvement. Our method provides effective experimental robustness to piFP with a natural algorithmic extension, paving the way for its application in both macroscopic and microscopic imaging.

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Section: Methodsmentioning

confidence: 99%

Toward robust super-resolution imaging: A low-rank approximation approach for pattern-illuminated Fourier ptychography

Zhang,

Wei,

Yang

et al. 2024

APL Photonics

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“…Young's interferometer, Michelson's interferometer, Mach-Zehnder's interferometer are examples of non-common-path interferometers [1]. Lateral shearing interferometer (LSI) [6], Zernike's phase contrast interferometer [21], and quantitative differential interference contrast (qDIC) interferometer [22] are examples of common-path interferometers. The lateral shearing interferometer provides a fieldof-view of approximately 165µm x 135µm, and the theoretical resolution of 0.6µm by the Rayleigh criterion and temporal stability as 0.76nm.…”

Section: Non-contact Measuring Systemsmentioning

confidence: 99%

“…As we mentioned in section 2, Lateral shearing interferometer (LSI) [6], Zernike's phase contrast interferometer [21], and quantitative differential interference contrast (qDIC) interferometer [22] are examples of common-path interferometers. The idea of the common-path interferometers is based on the fact that the beams travel and reflect in the same path at the same time.…”

Section: Common-path Non-contact Measuring Systemsmentioning

confidence: 99%

[Review Article] Recent Techniques in Surface Metrology

2021

Journal of Measurement Science and Applications (JMSA)

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An overview of the recent techniques used in surface metrology is presented. The techniques used in surface metrology can be classified into two: the first is contact measuring systems and the other is non-contact measuring systems. We start with explanation of the contact and non-contact measuring systems with their merits and demerits in surface metrology. Since the non-contact measuring systems have many advantages in surface metrology, so we proceed by focusing on the non-contact measuring systems and their recent technology. Then we proceed with explanation of the most common methods attached with the non-contact measuring systems used to extract the surface of the object being measured in three dimensional (3D). Recent techniques such as a rotating diffuser and convolution of Chebyshev type 2 and elliptic filters, proposed by the author, are explained in detail to enhance the measurement in surface metrology. Finally, we present some of potential applications in surface metrology such as measurement of steep smooth surfaces, rough surfaces, and opaque surfaces. The selected applications illustrate the major merits of using the non-contact measuring systems: it is possible to measure a relatively large field of view with high precision and in real-time. We end with an overview about estimation of the uncertainty budget in non-contact measuring systems.

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Structured illumination microscopy with partially coherent illumination for phase and fluorescent imaging

et al. 2021

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This study presents a partially coherent illumination based (PCI-based) SIM apparatus for dual-modality (phase and fluorescent) microscopic imaging. The partially coherent illumination (PCI) is generated by placing a rotating diffuser on a monochromatic laser beam, which suppresses speckle noise in the dual-modality images and endows the apparatus with sound sectioning capability. With this system, label-free quantitative phase and super-resolved/sectioned fluorescent images can be obtained for the same sample. We have demonstrated the superiority of the system in phase imaging of transparent cells with high endogenous contrast and in a quantitative manner. In the meantime, we have also demonstrated fluorescent imaging of fluorescent beads, rat tail crosscut, wheat anther, and hibiscus pollen with super-resolution and optical sectioning. We envisage that the proposed method can be applied to many fields, including but not limited to biomedical, industrial, chemistry fields.

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Transmission Structured Illumination Microscopy for Quantitative Phase and Scattering Imaging

Cited by 5 publications

References 35 publications

Toward robust super-resolution imaging: A low-rank approximation approach for pattern-illuminated Fourier ptychography

Toward robust super-resolution imaging: A low-rank approximation approach for pattern-illuminated Fourier ptychography

[Review Article] Recent Techniques in Surface Metrology

Structured illumination microscopy with partially coherent illumination for phase and fluorescent imaging

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