Transmission electron microscopy of uranium

Angerman, C.L.

doi:10.1016/0022-3115(63)90174-0

Cited by 7 publications

(8 citation statements)

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“…All potentials representing stable polishing were ultimately limited in current density at 20-25 mA/cm 2 at 210s. 30 mA/cm 2 has been reported as optimal polishing conditions using a similar solution [15].…”

Section: Polishing Potentialsmentioning

confidence: 90%

Preparation and analysis of strain-free uranium surfaces for electron and x-ray diffraction analysis

Sutcliffe

Petherbridge

Cartwright

et al. 2019

Materials Characterization

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This work describes a methodology for producing high quality metallic surfaces from uranium primarily for characterisation and investigations involving electron backscatter diffraction. Electrochemical measurements have been conducted to inform ideal polishing conditions to produce surfaces free from strain, induced by mechanical polishing. A commonly used solution for the electropolishing of uranium, consisting in part of phosphoric acid, was used to conduct the electrochemical experiments and polishing. X-ray diffraction techniques focusing on the surface show low stresses and strains are exhibited within the material. This is mirrored in good quality electron backscatter diffraction.

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Section: Polishing Potentialsmentioning

confidence: 90%

Preparation and analysis of strain-free uranium surfaces for electron and x-ray diffraction analysis

Sutcliffe

Petherbridge

Cartwright

et al. 2019

Materials Characterization

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show abstract

“…at 500 kv. The maximum magnification is 100,000X and the resolution better than 20 A. The maximum camera length of selected area diffraction is about 2 meters.…”

Section: Instrumentsmentioning

confidence: 99%

“…Angerman (20) prepared thin uranium foils for transmission electron microscopy by the anodic treatment of thin U specimens in a solution of alcohol, ethylene glycol, and H3P04 at room temperature and a current density of 30 ma./sq. cm.…”

Section: Metalsmentioning

confidence: 99%

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Electron Microscopy

Felton¹,

Greider²

1966

Anal. Chem.

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“…Several references to sample preparation of uranium for TEM analysis appear in the literature (Ammons, 1976;Angerman, 1963Angerman, , 1965Davies, 1968, Douglass, 1965Ferguson, 1972;Greulich, 1969;Kloepper, 1966;Makin, 1960;Mastel et al, 1965;Porter & Rickman, 1968;Romig, 1981;Romig et al, 1982), but the studies in this laboratory found the published procedures to be inadequate. The procedures were either useful for only a limited number of alloys or produced samples with oxide layers too thick for analytical electron microscopy.…”

Section: Introductionmentioning

confidence: 99%