2016
DOI: 10.1016/bs.aiep.2016.09.002
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Transmission Electron Microscopy

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Cited by 17 publications
(5 citation statements)
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“…Focused ion beam. Thin sections suited for TEM investigation were prepared using the 'Lift-out' technique (Sciau et al, 2009;Sciau, 2016) in a Helios NanoLab 600i dual beam (Thermofisher) equipped with a Ga ion source. This preparation method was chosen to enable a precise selection of the areas of interest thanks to the backscattered electron detector.…”
Section: Sample Preparationmentioning
confidence: 99%
See 1 more Smart Citation
“…Focused ion beam. Thin sections suited for TEM investigation were prepared using the 'Lift-out' technique (Sciau et al, 2009;Sciau, 2016) in a Helios NanoLab 600i dual beam (Thermofisher) equipped with a Ga ion source. This preparation method was chosen to enable a precise selection of the areas of interest thanks to the backscattered electron detector.…”
Section: Sample Preparationmentioning
confidence: 99%
“…Transmission electron microscopy (TEM) is perfectly suited to reach such scales and precisely characterize complex nanometric structures (Sciau, 2016). Its inherent coupling with electron diffraction and the possibility to implement energydispersive spectroscopy (EDS) allows both crystallographic and elemental characterizations at the nanoscale.…”
Section: Introductionmentioning
confidence: 99%
“…SEM scans the surface of the sample and creates an image detecting the reflected electrons, while TEM uses transmitted electrons that create the image by passing through a thin sample. SEM provides information on the surface of the sample at macro-and micro-scales, whereas TEM provides details of the inner structure of the sample at the nanoscale [135,136].…”
Section: Characterizing Ha Crystalsmentioning
confidence: 99%
“…The TEM mode that is commonly used in the field of cultural heritage is the bright-field (BF) imaging method. In this case, areas including elements of higher atomic numbers are presented darker, compared with the ones that contain lighter elements [65].…”
Section: Tem Analysismentioning
confidence: 99%